Reduce Risk for Electronics Automated Test Set Development
Engineers creating production test solutions for board electronics, system controllers and line replaceable units (LRUs), and power electronics systems need to reduce the cost and risk associated with developing and maintaining automated test sets (ATSs) that must last the lifecycle of the asset. Future-proofing the software architecture can account for the inevitability of instrumentation obsolescence. The key requirements for a solution like this are:
- A modular software architecture and reusable libraries to accelerate development across multiple projects and programs.
- Collaboration features for numerous and often geographically dispersed developers who are working in multiple languages.
- Minimal time and risk involved in adding new system capabilities or managing obsolete instrumentation.
Electronics Manufacturing Test Solution for Aerospace and Defense
- Off-the-shelf application software provides a higher-level starting point for test.
- Custom software can be created with modern programming languages such as G, C, C#, Python, and more.
- InstrumentStudio™ software helps monitor and interactively debug system errors.
- SystemLink™ software helps you create deployment packages, manage system configurations, streamline data aggregation and insight, and connect to manufacturing execution systems (MESs).
Solution Advantages
-
Offers the only full suite of modular software for production test of electronics systems for aerospace and defense including hardware integration, code modules, test executives, system management, and MES integration.
-
Creates comprehensive hardware and measurement abstraction layers, code modules, sequencing engines, and automation frameworks.
-
Customizes the solution by integrating hardware from different vendors and code from different languages into a single test program set (TPS).
-
Deploys packages, manage system configurations, streamline data aggregation and insight, and connect to MESs with SystemLink software.
" Our Automated Test Engineering team was able to achieve up to 60 percent code reuse for each automated test and reduce overall test development time by up to 9X. Using the NI certification program, coupled with in-house training, we were able to develop the skills necessary to produce robust, flexible code—and maintain it across more than 200 test benches."
L3 Technologies
BUILD YOUR SOLUTION WITH THE NI ECOSYSTEM
NI offers a variety of solution integration options customized to your application-specific requirements. You can use your own internal integration teams for full system control or leverage the expertise of NI and our worldwide NI Partner Network to obtain a turnkey solution.
Le Réseau de partenaires NI est une communauté mondiale d'experts en développement de domaines, d'applications et de tests globaux travaillant en étroite collaboration avec NI pour répondre aux besoins de la communauté des ingénieurs. Les partenaires NI sont des gestionnaires de solutions de confiance, des intégrateurs de systèmes, des consultants, des développeurs de produits et des experts des services et des canaux de vente qualifiés dans un large éventail d'industries et de domaines d'application.
NI partners with you throughout the life cycle of your application by delivering training, technical support, consultation and integration services, and maintenance programs. Accelerate your learning with our company-specific and geographic user groups. Build proficiency with online and in-person training options.
Aerospace and Defense Electronics Manufacturing Test Solution Brochure
Learn how you can reduce the cost and risk associated with developing and maintaining automated test sets (ATSs) that must last the lifecycle of your test system. NI’s solution for ATS and test program set (TPS) development scales to meet your current and future electronics test needs.
Un partenaire NI est une entité professionnelle indépendante avec laquelle il n’existe aucune relation d’agence, de partenariat ou de « joint-venture » entre ces entités et NI.