Reduce Risk for RF and Microwave Component and Module Test
Passive and active electronically scanned arrays (ESAs) play a critical role in harnessing and defending the electromagnetic spectrum in modern radar and SATCOM applications. Mission success revolves around the characterization and production test of the RF and microwave semiconductor components within these systems. Technological innovations in this area are creating significant design and test challenges, including:
- More efficient high-power RF devices based on modern GaN process technologies
- Increasingly complex RF components and modules with progressively wider bandwidths
- Multichannel RF front ends to handle frequency agile and multiband applications
- More RF channel and high-speed digital I/O integration
- Software defined digital processing capabilities to meet multifunction application needs
Electronically Scanned Array (ESA) Characterization Reference Architecture
- Wide coverage of DC, RF, and digital interface needs for mixed-I/O testing applications
- Scalable configurations for component, module, and sub-assembly test
- Pulsed measurements optimal for radar component validation including pulse to pulse stability and S-parameters
- Unified software for developing, debugging, and deploying test systems and applications
- Additional measurements available with RFmx and InstrumentStudio software
Solution Advantages
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Leverage NI’s modular platform to develop test systems that meet your high-mix, low-volume needs
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Reduce capital cost substantially using high-performance test equipment versus traditional instruments
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Capture better data faster and run multiple test cases simultaneously with NI’s leading measurement speed and quality
“Teams working on the next generations of phased array technology face intense market pressures. Technology advancements create new testing scenarios that must be addressed in less time than previous generations, and traditional approaches have lacked the scalability to meet this challenge while adding risk. The Electronically Scanned Array Characterization Reference Architecture allows teams to validate and test the next generation of phased arrays and their components confidently and in a more scalable fashion than traditional solutions on the market."
–Luke Schreier, SVP & GM, Aerospace, Defense, and Government BU, NI
Build Your Solution with the NI Ecosystem
NI propose plusieurs options d’intégration de solutions adaptées aux besoins spécifiques de votre application. Vous pouvez utiliser vos propres équipes d’intégration internes pour un contrôle complet du système ou tirer parti de l’expertise de NI et de notre réseau mondial de partenaires NI pour obtenir un système clé en main.
Le Réseau de partenaires NI est une communauté mondiale d'experts en développement de domaines, d'applications et de tests globaux travaillant en étroite collaboration avec NI pour répondre aux besoins de la communauté des ingénieurs. Les partenaires NI sont des gestionnaires de solutions de confiance, des intégrateurs de systèmes, des consultants, des développeurs de produits et des experts des services et des canaux de vente qualifiés dans un large éventail d'industries et de domaines d'application.
NI partners with you throughout the life cycle of your application by delivering training, technical support, consultation and integration services, and maintenance programs. Accelerate your learning with our company-specific and geographic user groups. Build proficiency with online and in-person training options.
ESA Characterization Reference Architecture Brochure
Discover how the ESA Characterization Reference Architecture can help you validate and test the latest generation of ESA components, modules, and sub-assemblies for radar, EW, and SATCOM with a modular approach to developing test systems that scales to meet high-mix, low-volume test requirements.
Un partenaire NI est une entité professionnelle indépendante avec laquelle il n’existe aucune relation d’agence, de partenariat ou de « joint-venture » entre ces entités et NI.