NI PTS is a flexible, high-throughput semiconductor parametric test system based on the NI PXI platform. Through industry-leading channel density, parallelism, and measurement speed, the PTS helps users obtain faster insight into semiconductor process qualification data.
48 channels of precision SMU instrumentation
Best choice for maximum leverage of per-pin parallelism
32 channels of precision SMU instrumentation
Upgrade kit to 48 channels available
16 channels of precision SMU instrumentation
Upgrade kit to 32 channels available
Best entry point with option to upgrade
Let's Talk about Other Parametric Test Options
If your needs aren't met by a standard NI PTS configuration, contact us. We can leverage the broad portfolio of instrumentation in our PXI platform to help you design a system to exactly meet your needs.
Wafer-Level Reliability (WLR) Test Software leverages NI's PTS for wafer-level reliability testing and makes it simple to perform JEDEC-compliant stress tests like TDDB, HCI, BTI, and more—no coding required. This software also provides LabVIEW, C#, and Python APIs for custom development use cases.
Our PTS documentation will tell you everything you need to know from system overview to system bring-up to maintenance and best practices.
The backbone of the PTS is NI’s high-performance PXIe-1095 chassis.