Testing RFICs With the STS

Aperçu

Learn how to lower test cost by testing multiple WLAN front-end modules in parallel. The Semiconductor Test System (STS) takes advantage of the PXI platform and high-performance PXI instrumentation to offer a lower cost approach to RFIC production test. In this demonstration, you not only learn about STS test coverage such as S-parameters and error vector magnitude measurements but also explore specialized test software for semiconductor production test.

Next steps