This document contains the NI-Digital Pattern Driver known issues that were discovered before and since the release of NI-Digital Pattern Driver 2025 Q2. Known issues are performance issues or technical bugs that NI has acknowledged exist within this version of the product.
Not every issue known to NI appears on this list; it is intended to show the most severe and common issues that you may encounter and provide workarounds when possible. Other technical issues that you may encounter could occur through normal product use or system compatibility issues. You may find more information on these issues in NI’s Product Documentation, Knowledgebase, or Community; see Additional Resources.
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Bug Number |
Legacy ID |
Description |
Details |
|---|---|---|---|
| 1466065 |
Capturing History RAM on a pattern with Scan opcode may not work correctlyWhen using multiple Scan opcodes in a pattern and triggering History RAM on pattern label with a vector offset past the first Scan opcode, History RAM will return 0 samples. Workaround: Configure History RAM to trigger based on cycle offset instead of vector offset. |
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor: 19.0.1 | NI-Digital Pattern Driver and Digital Pattern Editor: 20.6 Resolved Version: N/A Added: Jul 24, 2021 |
|
| 3070159 |
.NET Applications built with NI-Digital Pattern Driver 2024 Q3.1 do not work with NI-Digital Pattern Driver 2025 Q2The NI-Digital Pattern Driver 2025 Q2 .NET policy files mistakenly omitted the version redirection information from version 2024 Q3.1. This prevents .NET applications compiled against 2024 Q3.1 from loading in NI-Digital Pattern Driver 2025 Q2.
Workaround: Recompile the .NET assembly with a version of NI-Digital Pattern Driver other than 2024 Q3.1 installed.
|
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2025 Q2 Resolved Version: N/A Added: Apr 4, 2025 |
|
| 3700622 |
When using scan opcodes on an Instrument Group with some instruments having <=16 scan pins, incorrect values for scan pins may be usedWhen executing a pattern when using an Instrument Group, some pins using the scan opcode may generate incorrect data when at least one instrument uses more than 16 pins as scan_in pins or more than 16 pins as scan_out pins, and at least one instrument uses 16 or fewer pins as scan_in pins or 16 or fewer pins as scan_out pins. Workaround: Avoid using Instrument Groups or ensure all instruments in the Instrument Group have either more than 16 scan pins or 16 or fewer scan pins in the pattern.
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Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2025 Q2 | NI-Digital Pattern Driver and Digital Pattern Editor: 2025 Q3 | NI-Digital Pattern Driver and Digital Pattern Editor: 2025 Q4 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2026 Q1 Added: Jan 27, 2026 |
Issues found in this section will not be listed in future known issues documents for this product.
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