The following items are notable issues fixed between the release of NI-Digital Pattern Driver 2024 Q3.1 and NI-Digital Pattern Driver 2025 Q2, including additional patches and service packs. If you have an issue ID, you can search this list to validate that the issue has been fixed. This is not an exhaustive list of issues fixed in the current version of NI-Digital Pattern Driver.
|
Bug Number |
Legacy ID |
Description |
Details |
|---|---|---|---|
| 2976055 |
Scan compression does not occur for instruments when no pins are configured as scan pinsWhen loading a pattern that contains a scan vector on an instrument that does not have any mapped scan pins, no scan pattern compression will occur. Workaround: Configure at least one pin as a scan pin on every instrument in the session.
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Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2025 Q2 Added: Apr 4, 2025 |
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| 2976055 |
Reported memory usage may be inaccurate with multi-instrument sessions when instruments have different numbers of scan pinsWhen loading a pattern in a multi-instrument session where every instrument does not have the same number of scan pins, the reported memory usage in Digital Pattern Editor may be inaccurate. Workaround: Configure the same number of scan pins on every instrument in the session.
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Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2025 Q2 Added: Apr 4, 2025 |
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| 2795788 |
Digital Scope should constrain compare strobe edge within time-set periodFor patterns with multiple adjacent high frequency cycles, the Digital Scope operation may incorrectly place time-set comparator edges, violating hardware timing limits and resulting in incorrect noisy signals. Workaround: There is currently no known workaround for this issue. |
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2025 Q2 Added: Apr 4, 2025 |
|
| 2902761 |
When using Digital Pattern Editor with an older version of TestStand Semiconductor Module installed, System View may not display live measurementsWhen using Digital Pattern Editor with an older version of TestStand Semiconductor Module installed, System View may not display live measurements. This applies to TestStand Semiconductor Module versions 2024Q1 and earlier.
Workaround: There is currently no known workaround for this issue. |
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor: 2025 Q2 Added: Apr 4, 2025 |
Installing some patches may require certain additional steps or considerations. Please refer to the following table for more information about patches for this release.
These patches currently do not have any special instructions.