This document contains the NI-Digital Pattern Driver known issues that were discovered before and since the release of NI-Digital Pattern Driver 2025 Q3. Known issues are performance issues or technical bugs that NI has acknowledged exist within this version of the product.
Not every issue known to NI appears on this list; it is intended to show the most severe and common issues that you may encounter and provide workarounds when possible. Other technical issues that you may encounter could occur through normal product use or system compatibility issues. You may find more information on these issues in NI’s Product Documentation, Knowledgebase, or Community; see Additional Resources.
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Bug Number |
Legacy ID |
Description |
Details |
|---|---|---|---|
| 1466065 |
Capturing History RAM on a pattern with Scan opcode may not work correctlyWhen using multiple Scan opcodes in a pattern and triggering History RAM on pattern label with a vector offset past the first Scan opcode, History RAM will return 0 samples.
Workaround: Configure History RAM to trigger based on cycle offset instead of vector offset.
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Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 19.0.1 | NI-Digital Pattern Driver and Digital Pattern Editor 20.6 Resolved Version: N/A Added: Jul 23, 2021 |
|
| 3700622 |
When using scan opcodes on an Instrument Group with some instruments having <=16 scan pins, incorrect values for scan pins may be usedWhen executing a pattern when using an Instrument Group, some pins using the scan opcode may generate incorrect data when at least one instrument uses more than 16 pins as scan_in pins or more than 16 pins as scan_out pins, and at least one instrument uses 16 or fewer pins as scan_in pins or 16 or fewer pins as scan_out pins. Workaround: Avoid using Instrument Groups or ensure all instruments in the Instrument Group have either more than 16 scan pins or 16 or fewer scan pins in the pattern.
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Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q2 | NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q3 | NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q4 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2026 Q1 Added: Jan 27, 2026 |
|
| 3739502 |
When using the Scan opcode with ungrouped instruments, incorrect pin data may be usedWhen using ungrouped instruments in a multi-card pin map (i.e., the 'group' field is blank for all instruments), loading patterns with a scan opcode after loading other patterns may generate incorrect pin data in the scan vectors. Workaround: Load the scan pattern before other patterns.
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Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q3 Patch 2 Added: Mar 26, 2026 |
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| 3734444 |
Upgrading NI-Digital Pattern Driver causes self-calibration to fail on some PXIe-6570 and PXIe-6571 instrumentsNI-Digital Pattern Driver 2025 Q3 improved the self-calibration algorithm to allow for lower active load current levels. This introduced a bug which causes some boards to generate faulty self-calibration data. Workaround: Uninstall NI-Digital Pattern Driver and install a version older than 2025 Q3.
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Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q3 Patch 2 Added: Mar 26, 2026 |
Issues found in this section will not be listed in future known issues documents for this product.
There are currently no issues to list.
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