This document contains the TestStand Semiconductor Module known issues that were discovered before and since the release of TestStand Semiconductor Module 2024 Q3. Known issues are performance issues or technical bugs that NI has acknowledged exist within this version of the product.
Not every issue known to NI appears on this list; it is intended to show the most severe and common issues that you may encounter and provide workarounds when possible. Other technical issues that you may encounter could occur through normal product use or system compatibility issues. You may find more information on these issues in NI’s Product Documentation, Knowledgebase, or Community; see Additional Resources.
|
Bug Number |
Legacy ID |
Description |
Details |
|---|---|---|---|
| 2937353 |
A Runtime Error Is Thrown When Running An Older Test Program In A Newer Version Of TSMYou may encounter a run-time error similar to the following when running an older test program which contains deprecated step types: Error executing substep 'Pre'. An exception occurred inside the call to .NET member 'PreSubstep': Unknown variable or property name 'TestSettings'. Error accessing item 'Step.TestSettings.OfflineModeMeasurementDataOption'.
Workaround: Run the test program in a version of TSM earlier than TSM 2023 Q1. This issue no longer exists in TSM 2024 Q3.1 or later. |
Reported Version: STS Software Bundle: 24.5 | TestStand Semiconductor Module 2024 Q3 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Added: Jun 13, 2025 |
|
| 2865955 |
The Evaluations Properties Contain Additional Attributes After Editing Tests On A TSM StepCertain changes in the Tests pane of a TSM step may result in the creation of additional attributes to those tests. These attributes are intended for run-time use only. Some examples of these attributes include:
Workaround: There is currently no known workaround for this issue. |
Reported Version: TestStand Semiconductor Module 2024 Q1 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Added: Jun 13, 2025 |
|
| 2798879 |
The Pin Map Editor May Not Display The Tester Channel For Some DAQmx ConnectionsWorkaround: There is currently no known workaround for this issue. |
Reported Version: TestStand Semiconductor Module 2024 Q1 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Added: Jun 13, 2025 |
|
| 2866118 |
The TSM Sequence Editor Layout Is Missing Some Toolbar Items And Menu ItemsThe following items are absent from the layout:
Workaround: The default toolbars and menus in the TestStand Sequence Editor are fully customizable. See Customizing TestStand Sequence Editor Toolbars and Menus for more information.
|
Reported Version: TestStand Semiconductor Module 2024 Q1 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Added: Jun 13, 2025 |
|
| 2897302 |
Performance Decreases While The Runtime Data Viewer Is OpenThe performance of certain test programs may decrease substantially when running while the Runtime Data Viewer is open.
Workaround: There is currently no known workaround for this issue. |
Reported Version: TestStand Semiconductor Module 2024 Q1 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Added: Jun 30, 2025 |
|
| 2810878 |
You Are Unable To Change The Behavior Of Multiple Alarms At Once When Multiple Alarms Are SelectedWhen you have multiple alarms selected in the 'Alarms' panel of the Test Program Editor and you change the alarm behavior, only the alarm in the row that you directly modify is updated.
Workaround: Update the behavior individually for each alarm that you wish to modify.
|
Reported Version: TestStand Semiconductor Module 2024 Q3 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Patch 1 Added: Jun 30, 2025 |
|
| 3064832 |
Displaying The Mid-Lot Summary Report Causes The Operator Interface To Crash When Alarms Are EnabledWhen you request a mid-lot summary report and you have alarms enabled in your test program, an exception is thrown after which the operator interface crashes.
Workaround: Do not request a mid-lot summary while alarms are enabled in your test program.
|
Reported Version: TestStand Semiconductor Module 2022 Q2 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Patch 1 Added: Jun 30, 2025 |
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| 3163230 |
An Error Occurs Loading A Custom Presets File While An Execution Window Is In FocusAfter testing has completed, any Site window or the Controller window for your execution may still be in focus. If you attempt to load a custom presets file while an execution window is in focus, the Sequence Editor will throw an error due a null object reference.
Workaround: To avoid this issue, shift the focus to a non-execution window prior to loading a custom presets file.
|
Reported Version: TestStand Semiconductor Module 2024 Q3 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Patch 1 Added: Jun 30, 2025 |
|
| 2832520 |
The Sequence Analyzer Gives A Misleading Message When An Invalid Pinmap Is LoadedWhen an invalid pinmap file is loaded, the Sequence Analyzer fails to recognize that it is not a valid pinmap file and may provide misleading error messages. Such errors will often state that there are problems with certain steps, indicating that they need to be updated. Below is an example of the type of error you might receive in this state:
Workaround: Modify your test program to use a valid pin map file to avoid this issue.
|
Reported Version: TestStand Semiconductor Module 2024 Q3 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Patch 1 Added: Jun 30, 2025 |
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| 2864647 |
The Limits Reader Gives An Inaccurate Message When A Row Contains Too Few Data PointsIf you attempt to import limits from a limits file containing a row with fewer data points than expected, the limits reader will display a message in which the number of data points found is off by a value of plus 1. For example, if your test is expecting ten columns of data where the row in your limits file contains only six data points, the error received will inaccurately state that seven data points were found:
This can be especially confounding if your limits file contains a row which is one data point short of the expected number of data columns. (For example, your row contains nine data points where ten columns of data are expected.) In this case, the error you receive will read similar to the following:
Workaround: There is currently no known workaround for this issue. |
Reported Version: TestStand Semiconductor Module 2024 Q1 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Patch 1 Added: Jun 30, 2025 |
|
| 3263889 |
Slow Response While Updating The Test Table In A Semiconductor Multi Test StepUsers may encounter a slow response while scrolling the test table in a Semiconductor Multi Test step when their test program meets the following criteria:
Workaround: Users can work around this issue using one of the two methods described below.
Method 1: Relocate the pin map file to be placed within the same directory as the test program sequence file. Method 2:
Perform the following steps:
|
Reported Version: TestStand Semiconductor Module 2021 Q4 Resolved Version: TestStand Semiconductor Module 2026 Q1 Added: N/A |
|
| 3799430 |
Copying Data To The Clipboard While A Test Is Running May Cause The Runtime Data Viewer To CrashIf a test is running when you click the button to copy your test data to the clipboard, the Runtime Data Viewer may crash depending upon how the results are sorted.
Workaround: There is currently no known workaround for this issue. |
Reported Version: TestStand Semiconductor Module 2024 Q1 Resolved Version: TestStand Semiconductor Module 2026 Q1 Added: N/A |
|
| 2910800 |
Using The TSM 'Set Relays' Step On DAQmx-Based Relays Throws A Type Cast ExceptionUsing the TSM 'Set Relays' step to control a NI-DAQmx-based relay throws a type cast exception when the following conditions are true:
Workaround: The work around this issue, you can use a polymorphic instance of TSM's 'Control Relay(s).vi' within a LabVIEW code module:
|
Reported Version: TestStand Semiconductor Module 2024 Q3 Resolved Version: TestStand Semiconductor Module 2026 Q1 Added: N/A |
|
| 3749127 |
The Runtime Data Viewer 'Summary' Tab Does Not Always Highlight Column Headers In Red When Alarms Are ReportedWhen the first multi-test step in a sequence is the only step which reports an alarm, the column header is not highlighted in red as expected for columns containing those test results. However, the corresponding cells containing those results do have a red border highlight as expected.
Workaround: There is currently no known workaround for this issue. |
Reported Version: TestStand Semiconductor Module 2024 Q1 Resolved Version: TestStand Semiconductor Module 2026 Q1 Added: N/A |
|
| 3054716 |
You Cannot Add Data to an Empty Limits File in the Test Limits EditorIf you open an empty test limits file using the Test Limits Editor, such as a file containing the required header but no other data, and add a new row, the application crashes when you attempt to edit that row. Workaround: There is currently no known workaround for this issue. |
Reported Version: TestStand Semiconductor Module 2024 Q3 Patch 1 Resolved Version: N/A Added: N/A |
Issues found in this section will not be listed in future known issues documents for this product.
There are currently no issues to list.
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