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TestStand Semiconductor Module 2024 Q3.1 Known Issues

Updated Jul 3, 2026

Overview

This document contains the TestStand Semiconductor Module known issues that were discovered before and since the release of TestStand Semiconductor Module 2024 Q3.1. Known issues are performance issues or technical bugs that NI has acknowledged exist within this version of the product.

 

Not every issue known to NI appears on this list; it is intended to show the most severe and common issues that you may encounter and provide workarounds when possible. Other technical issues that you may encounter could occur through normal product use or system compatibility issues. You may find more information on these issues in NI’s Product Documentation, Knowledgebase, or Community; see Additional Resources.

Bug Number

Legacy ID

Description

Details
2910310

Configuration Presets Do Not Always Set The Run-Time Error Option As Expected

Under certain test environments, the On Run-Time Error option may remain unchanged after loading configuration presets in TSM.

Workaround:

Users can find the current setting for this option by doing the following:
  • Open the 'Configure Station' menu item
  • Navigate to the 'Advanced' tab of the 'Configure Station Settings' dialog and select 'Station Options'
  • Navigate to the 'Execution' tab of the 'Station Options' dialog
  • View the current option (or select the desired option) from the drop-down menu for the 'On Run-Time Error' setting (shown below)

Image

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
2810878

You Are Unable To Change The Behavior Of Multiple Alarms At Once When Multiple Alarms Are Selected

When you have multiple alarms selected in the 'Alarms' panel of the Test Program Editor and you change the alarm behavior, only the alarm in the row that you directly modify is updated.

Workaround:

Update the behavior individually for each alarm that you wish to modify.

Reported Version:

TestStand Semiconductor Module 2024 Q3

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
3064832

Displaying The Mid-Lot Summary Report Causes The Operator Interface To Crash When Alarms Are Enabled

When you request a mid-lot summary report and you have alarms enabled in your test program, an exception is thrown after which the operator interface crashes.

Workaround:

Do not request a mid-lot summary while alarms are enabled in your test program.

Reported Version:

TestStand Semiconductor Module 2022 Q2

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
2846385

The STDF Results Processor Does Not Error If A Result Status Is Invalid

If you set a result status to an invalid value (for example, by modifying the value using a post-expression on your test), the STDF results processor does not detect the error and may incorrectly report a passing result.

Workaround:

Ensure that you are using only valid result status values for any results which you choose to modify.

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
3156662

Some Channels In Your RF Subsystem May Not Be Correctly Identified In Offline Mode

In certain RF subsystem configurations, some channels may not be correctly identified while in Offline Mode.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1 Patch 2

Added:

N/A
3261644

Too Many Raised Alarms In A Single Step Causes A Run-Time Error When STDF Is Enabled

If too many alarms are raised in a single step, then TSM attempts to write an ALARM_ID field that is longer than the maximum character limit supported by STDF (255).

Workaround:

Users can work around this issue using one of the three options described below.
  1. Disable alarm logging
  2. Disable STDF
  3. If you are using STS Software 24.5.3 and encounter this issue, you may apply the hotfix 'NISTSFeatureHotfix3.245.0'

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
3263889

Slow Response While Updating The Test Table In A Semiconductor Multi Test Step

Users may encounter a slow response while scrolling the test table in a Semiconductor Multi Test step when their test program meets the following criteria:
  • The Pin Map file uses a relative file path
  • Both of the following settings are enabled for the 'Current sequence file directory':
    • The Search Directories setting
    • The 'Search Subdirectories' option
You can check these settings using the TestStand Sequence Editor menus by selecting 'Configure' >> 'Search Directories...'

Workaround:

Users can work around this issue using one of the two methods described below.

Method 1:
Relocate the pin map file to be placed within the same directory as the test program sequence file.

Method 2:
Perform the following steps:
  • From the TestStand Sequence Editor menus, select 'Configure' >> 'Search Directories...'
  • Disable the 'Search Subdirectories' option for 'Current sequence file directory'
  • Click 'OK' to save the settings and close the dialog
  • From the TestStand Sequence Editor menus, select 'Semiconductor Module' >> 'Edit Test Program: <Sequence File Name>...' to open the Test Program Editor
  • Using the Test Program Editor, update the Pin Map File Path and ensure that the updated relative path correctly resolves without errors
  • Click 'OK' to save your changes and close the Test Program Editor

Reported Version:

TestStand Semiconductor Module 2021 Q4

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
3803022, 3881489

Enabling Alarms On NI-DCPower Sessions Containing A PXIe-4150/PXIe-4151 Causes A Run-Time Error

If you enable alarms in TSM, initializing an NI-DCPower session containing either NI PXIe-4150 or NI PXIe-4151 will throw a run-time error.

Workaround:

To work around this issue, users can perform one of the options below:

  • If you are using STS Software Bundle 24.5.3 or earlier, upgrade to STS Software Bundle 25.0 or later
  • If you are not using the STS Software Bundle, upgrade your NI-DCPower driver directly to version 2025 Q1 or later
  • If you are unable to upgrade to either of the recommended versions, you must disable alarms to avoid this issue

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
3799430

Copying Data To The Clipboard While A Test Is Running May Cause The Runtime Data Viewer To Crash

If a test is running when you click the button to copy your test data to the clipboard, the Runtime Data Viewer may crash depending upon how the results are sorted.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
2910800

Using The TSM 'Set Relays' Step On NI-DAQmx-Based Relays Throws A Type Cast Exception

Using the TSM 'Set Relays' step to control a NI-DAQmx-based relay throws a type cast exception when the following conditions are true:
  • The relay, relay group or relay configuration contains a NI-DAQmx digital output-based relay
  • The NI-DAQmx tasks are created by code modules written in LabVIEW 
  • The LabVIEW Adapter is configured to use the LabVIEW Runtime Engine
Relays based on NI-SWITCH are not affected. 

Workaround:

The work around this issue, you can use a polymorphic instance of TSM's 'Control Relay(s).vi' within a LabVIEW code module:
  • ControlRelaySingleAction.vi
  • ControlRelaysMultipleActions.vi 
  • ApplyRelayConfiguration.vi

Reported Version:

TestStand Semiconductor Module 2024 Q3

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
3222534, 3232035

You Encounter A Runtime Error After Initializing NI-DCPower Sessions When A PXI-4110 Is In Your Pin Map

When you use a multi-instrument session (grouping all NI-DCPower instruments into a single session), and your Pin Map contains a PXI-4110 power supply with alarms enabled, a runtime error occurs after the NI-DCPower sessions are initialized.

Workaround:

To work around this issue, you must do one of the following:
  • Disable alarms
  • Have any PXI-4110 power supplies in their own separate session (if you are using a multi-instrument session)
  • Do not use a multi-instrument session

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
3242270

Trying To Configure Result Processors Results In A Runtime Error If No Executions Have Run

If you open the TestStand Sequence Editor and try to configure any result processors (STDF, Debug Test Results Log, and so on) before running any sequences, you will receive a runtime error.

Workaround:

To work around this issue, you must execute any sequence before attempting to configure result processors.

Note: If you unload all code modules from memory, the issue will reappear. You will then need to perform this workaround again.

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
3749127

The Runtime Data Viewer 'Summary' Tab Does Not Always Highlight Column Headers In Red When Alarms Are Reported

When the first multi-test step in a sequence is the only step which reports an alarm, the column header is not highlighted in red as expected for columns containing those test results. However, the corresponding cells containing those results do have a red border highlight as expected.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
2911468

The Test Limits Editor Crashes When Loading Malformed Limits Files

The Test Limits Editor silently crashes if you open it using a test program which contains any malformed limits files.


Some examples of malformed limits files are files which:
  • Contain rows having more columns of data than there are header columns
  • Do not have beginning or end tags: <SemiconductorModuleTests></SemiconductorModuleTests>

Workaround:

To avoid this issue, carefully review your limits files and correct any issues found prior to opening the Test Limits Editor.

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

May 14, 2025
2911570

The Test Limits Editor Should State Which Data Is Duplicated In Base Test Limits

A base test limits file may not contain multiple rows having identical data for any values which identify the corresponding test for those limits. (These test identification values include: SequenceName, StepName, StepID, TestName, and TestNumber.) When the Test Limits Editor encounters such a file being designated as a base limits file, it throws an error citing: "An item with the same key has already been added." This message needs to be more descriptive to highlight for the user which values are being duplicated.

Workaround:

If you encounter this error, you should check your base test limits file for any duplication of test-identifying values and modify the file to avoid such duplication.

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

May 14, 2025
3823846, 3851339

Synchronizing Threads In A Multisite Execution Using .NET Reports An Error When Alarms Are Enabled

When synchronizing threads in a Multisite execution using .NET, if an instrument in the test program contains a set of alarms but another instrument in the same session only supports a subset of these alarms, an error occurs.

Workaround:

You may need to assign unique channel group names to each instrument which supports alarms to work around this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
3823846, 3851339

Synchronizing Threads In A Multisite Execution Using LabVIEW Reports An Error When Alarms Are Enabled

When synchronizing threads in a Multisite execution using LabVIEW, if an instrument in the test program contains a set of alarms but another instrument in the same session only supports a subset of these alarms, an error occurs.

Workaround:

You may need to assign unique channel group names to each instrument which supports alarms to work around this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

N/A

Added:

N/A
3054716

You Cannot Add Data to an Empty Limits File in the Test Limits Editor

If you open an empty test limits file using the Test Limits Editor, such as a file containing the required header but no other data, and add a new row, the application crashes when you attempt to edit that row.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q3 Patch 1

Resolved Version:

N/A

Added:

N/A

Final Time Issue Listed

Issues found in this section will not be listed in future known issues documents for this product.

Bug Number

Legacy ID

Description

Details
3068909

Some TSM Sequence Files Appear Modified When Opened In The Sequence Editor

Some NI sequence files shipped with TSM 2024 Q3.1 appear as modified when opened in the Sequence Editor due to containing an older version of one or more TestStand types. NI has confirmed that this issue does not cause errors or incorrect execution.

The impact is that you receive a warning dialog when closing these files asking if you wish to save any changes to them. These files can be safely closed without saving any changes. Alternately, if you have the required user permissions to do so, you may save the files in order to avoid seeing the dialog again moving forward.

The impacted files are listed below:
  • NI_SemiconductorModule_Core.seq
  • NI_SemiconductorModule_LotTestingComplete.seq
  • NI_SemiconductorModulePerformanceMeasurementHandler.seq
  • NI_SemiconductorModuleSimulatedHandler.seq
  • HandlerProberDriver.seq
  • InlineQAAlgorithm.seq

Workaround:

Open the files and save them to update the TestStand types.

Reported Version:

TestStand Semiconductor Module 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1 Patch 1

Added:

Jun 30, 2025

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Glossary of Terms

 

  • Bug ID - When an issue is reported to NI, you may be given this ID or find it on ni.com.  You may also find IDs posted by NI on the discussion forums or in KnowledgeBase articles.
  • Legacy ID – An older issue ID that refers to the same issue.  You may instead find this issue ID in older known issues documents.
  • Description - A few sentences which describe the problem. The brief description given does not necessarily describe the problem in full detail.
  • Workaround - Possible ways to work around the problem.
  • Reported Version - The earliest version in which the issue was reported.
  • Resolved Version - Version in which the issue was resolved or was no longer applicable. "N/A" indicates that the issue has not been resolved.
  • Date Added - The date the issue was added to the document (not the reported date).