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TestStand Semiconductor Module 2024 Q3.1 Bug Fixes

Updated Aug 7, 2025

Overview

The following items are notable issues fixed between the release of TestStand Semiconductor Module 2024 Q3 and TestStand Semiconductor Module 2024 Q3.1, including additional patches and service packs. If you have an issue ID, you can search this list to validate that the issue has been fixed. This is not an exhaustive list of issues fixed in the current version of TestStand Semiconductor Module.

Bug Number

Legacy ID

Description

Details
2937353

A Runtime Error Is Thrown When Running An Older Test Program In A Newer Version Of TSM

You may encounter a run-time error similar to the following when running an older test program which contains deprecated step types:


Error executing substep 'Pre'.
An exception occurred inside the call to .NET member 'PreSubstep':
Unknown variable or property name 'TestSettings'.
Error accessing item 'Step.TestSettings.OfflineModeMeasurementDataOption'.

Workaround:

Run the test program in a version of TSM earlier than TSM 2023 Q1. This issue no longer exists in TSM 2024 Q3.1 or later.

Reported Version:

STS Software Bundle: 24.5 | TestStand Semiconductor Module: 2024 Q3

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1

Added:

Jun 13, 2025
2865955

The Evaluations Properties Contain Additional Attributes After Editing Tests On A TSM Step

Certain changes in the Tests pane of a TSM step may result in the creation of additional attributes to those tests. These attributes are intended for run-time use only. Some examples of these attributes include:

  • NI.SemiconductorModule.IsFirstRun
  • NI.SemiconductorModule.OriginalTestNumber

While the existence of these attributes is harmless, their presence has the potential to cause confusion when diffing sequence files.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module: 2024 Q1

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1

Added:

Jun 13, 2025
2798879

The Pin Map Editor May Not Display The Tester Channel For Some DAQmx Connections

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module: 2024 Q1

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1

Added:

Jun 13, 2025
2866118

The TSM Sequence Editor Layout Is Missing Some Toolbar Items And Menu Items

The following items are absent from the layout:

  • Buttons for the debug tools [Step Into/Step Over/Step Out] are missing from the toolbar
  • Start Lot is missing from the Execute menu
  • Single Test is missing from the Execute menu

Workaround:

The default toolbars and menus in the TestStand Sequence Editor are fully customizable. See Customizing TestStand Sequence Editor Toolbars and Menus for more information.

Reported Version:

TestStand Semiconductor Module: 2024 Q1

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1

Added:

Jun 13, 2025
2897302

Performance Decreases While The Runtime Data Viewer Is Open

The performance of certain test programs may decrease substantially when running while the Runtime Data Viewer is open.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module: 2024 Q1

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1

Added:

Jun 30, 2025
2910310

Configuration Presets Do Not Always Set The Run-Time Error Option As Expected

Under certain test environments, the On Run-Time Error option may remain unchanged after loading configuration presets in TSM.

Workaround:

Users can find the current setting for this option by doing the following:
  • Open the 'Configure Station' menu item
  • Navigate to the 'Advanced' tab of the 'Configure Station Settings' dialog and select 'Station Options'
  • Navigate to the 'Execution' tab of the 'Station Options' dialog
  • View the current option (or select the desired option) from the drop-down menu for the 'On Run-Time Error' setting (shown below)

Image

Reported Version:

TestStand Semiconductor Module: 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
2810878

You Are Unable To Change The Behavior Of Multiple Alarms At Once When Multiple Alarms Are Selected

When you have multiple alarms selected in the 'Alarms' panel of the Test Program Editor and you change the alarm behavior, only the alarm in the row that you directly modify is updated.

Workaround:

Update the behavior individually for each alarm that you wish to modify.

Reported Version:

TestStand Semiconductor Module: 2024 Q3

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
3064832

Displaying The Mid-Lot Summary Report Causes The Operator Interface To Crash When Alarms Are Enabled

When you request a mid-lot summary report and you have alarms enabled in your test program, an exception is thrown after which the operator interface crashes.

Workaround:

Do not request a mid-lot summary while alarms are enabled in your test program.

Reported Version:

TestStand Semiconductor Module: 2022 Q2

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
3163230

An Error Occurs Loading A Custom Presets File While An Execution Window Is In Focus

After testing has completed, any Site window or the Controller window for your execution may still be in focus. If you attempt to load a custom presets file while an execution window is in focus, the Sequence Editor will throw an error due a null object reference.

Workaround:

To avoid this issue, shift the focus to a non-execution window prior to loading a custom presets file.

Reported Version:

TestStand Semiconductor Module: 2024 Q3

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
2832520

The Sequence Analyzer Gives A Misleading Message When An Invalid Pinmap Is Loaded

When an invalid pinmap file is loaded, the Sequence Analyzer fails to recognize that it is not a valid pinmap file and may provide misleading error messages. Such errors will often state that there are problems with certain steps, indicating that they need to be updated. Below is an example of the type of error you might receive in this state:
  • Step specifies invalid DUT pins

Workaround:

Modify your test program to use a valid pin map file to avoid this issue.

Reported Version:

TestStand Semiconductor Module: 2024 Q3

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
2864647

The Limits Reader Gives An Inaccurate Message When A Row Contains Too Few Data Points

If you attempt to import limits from a limits file containing a row with fewer data points than expected, the limits reader will display a message in which the number of data points found is off by a value of plus 1. For example, if your test is expecting ten columns of data where the row in your limits file contains only six data points, the error received will inaccurately state that seven data points were found:

Too few data columns: Expected 10 columns of data, found only 7 columns.

This can be especially confounding if your limits file contains a row which is one data point short of the expected number of data columns. (For example, your row contains nine data points where ten columns of data are expected.)  In this case, the error you receive will read similar to the following:

Too few data columns: Expected 10 columns of data, found only 10 columns.




Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module: 2024 Q1

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
2846385

The STDF Results Processor Does Not Error If A Result Status Is Invalid

If you set a result status to an invalid value (for example, by modifying the value using a post-expression on your test), the STDF results processor does not detect the error and may incorrectly report a passing result.

Workaround:

Ensure that you are using only valid result status values for any results which you choose to modify.

Reported Version:

TestStand Semiconductor Module: 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
3068909

Some TSM Sequence Files Appear Modified When Opened In The Sequence Editor

Some NI sequence files shipped with TSM 2024 Q3.1 appear as modified when opened in the Sequence Editor due to containing an older version of one or more TestStand types. NI has confirmed that this issue does not cause errors or incorrect execution.

The impact is that you receive a warning dialog when closing these files asking if you wish to save any changes to them. These files can be safely closed without saving any changes. Alternately, if you have the required user permissions to do so, you may save the files in order to avoid seeing the dialog again moving forward.

The impacted files are listed below:
  • NI_SemiconductorModule_Core.seq
  • NI_SemiconductorModule_LotTestingComplete.seq
  • NI_SemiconductorModulePerformanceMeasurementHandler.seq
  • NI_SemiconductorModuleSimulatedHandler.seq
  • HandlerProberDriver.seq
  • InlineQAAlgorithm.seq

Workaround:

Open the files and save them to update the TestStand types.

Reported Version:

TestStand Semiconductor Module: 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
3156662

Some Channels In Your RF Subsystem Are Identified Incorrectly In Offline Mode

For certain RF subsystem configurations, some channels may not be correctly identified while in Offline Mode.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module: 2024 Q3.1

Resolved Version:

TestStand Semiconductor Module: 2024 Q3.1 Patch 2

Added:

N/A

Additional Patch Information

Installing some patches may require certain additional steps or considerations. Please refer to the following table for more information about patches for this release.

These patches currently do not have any special instructions.

Glossary of Terms

 

  • Bug ID - When an issue is reported to NI, you may be given this ID or find it on ni.com.  You may also find IDs posted by NI on the discussion forums or in KnowledgeBase articles.
  • Legacy ID – An older issue ID that refers to the same issue.  You may instead find this issue ID in older known issues documents.
  • Description - A few sentences which describe the problem. The brief description given does not necessarily describe the problem in full detail.
  • Workaround - Possible ways to work around the problem.
  • Reported Version - The earliest version in which the issue was reported.
  • Resolved Version - Version in which the issue was resolved or was no longer applicable. "N/A" indicates that the issue has not been resolved.
  • Date Added - The date the issue was added to the document (not the reported date).