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TestStand Semiconductor Module 2024 Q1 Known Issues

Updated Jul 3, 2026

Overview

This document contains the TestStand Semiconductor Module known issues that were discovered before and since the release of TestStand Semiconductor Module 2024 Q1. Known issues are performance issues or technical bugs that NI has acknowledged exist within this version of the product.

 

Not every issue known to NI appears on this list; it is intended to show the most severe and common issues that you may encounter and provide workarounds when possible. Other technical issues that you may encounter could occur through normal product use or system compatibility issues. You may find more information on these issues in NI’s Product Documentation, Knowledgebase, or Community; see Additional Resources.

Bug Number

Legacy ID

Description

Details
2563332

Multiple DAQmx Digital I/O Channel List Assignment Is Not Supported

You receive a warning in the Pin Map Editor or an error at runtime when trying to specify multiple digital lines to a channel in your DAQmx task. (e.g. dev1/port0/line0:7)

Workaround:

To mitigate the issue, you must migrate your test program to TSM 2024 Q3 or later.

Reported Version:

TestStand Semiconductor Module 2021 Q4

Resolved Version:

TestStand Semiconductor Module 2024 Q3

Added:

Jun 13, 2025
2631927

Intermittent Run-Time Error(s) May Be Reported When Initializing RF Sessions In Parallel

The errors may report any of the following:

  • Channel Group on Instrument [instrument_name] does not support sessions of type niRF[SG/SA/mx/etc.]
  • The given key was not present in dictionary

Workaround:

To work around this issue you must set your RF sessions sequentially rather than in parallel.

Reported Version:

STS Software Bundle: 24.0 | TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2024 Q3

Added:

Jun 13, 2025
2865955

The Evaluations Properties Contain Additional Attributes After Editing Tests On A TSM Step

Certain changes in the Tests pane of a TSM step may result in the creation of additional attributes to those tests. These attributes are intended for run-time use only. Some examples of these attributes include:

  • NI.SemiconductorModule.IsFirstRun
  • NI.SemiconductorModule.OriginalTestNumber

While the existence of these attributes is harmless, their presence has the potential to cause confusion when diffing sequence files.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1

Added:

Jun 13, 2025
2798879

The Pin Map Editor May Not Display The Tester Channel For Some DAQmx Connections

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1

Added:

Jun 13, 2025
2811757

The QueryForRaisedAlarms API Throws An Exception If Alarms Are Not Enabled

The error states that: "Query for Raised Alarms is not supported with this SemiconductorModuleContext."

Workaround:

Enable alarms to work around this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2024 Q3

Added:

Jun 13, 2025
2866118

The TSM Sequence Editor Layout Is Missing Some Toolbar Items And Menu Items

The following items are absent from the layout:

  • Buttons for the debug tools [Step Into/Step Over/Step Out] are missing from the toolbar
  • Start Lot is missing from the Execute menu
  • Single Test is missing from the Execute menu

Workaround:

The default toolbars and menus in the TestStand Sequence Editor are fully customizable. See Customizing TestStand Sequence Editor Toolbars and Menus for more information.

Reported Version:

TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1

Added:

Jun 13, 2025
2897302

Performance Decreases While The Runtime Data Viewer Is Open

The performance of certain test programs may decrease substantially when running while the Runtime Data Viewer is open.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1

Added:

Jun 30, 2025
3064832

Displaying The Mid-Lot Summary Report Causes The Operator Interface To Crash When Alarms Are Enabled

When you request a mid-lot summary report and you have alarms enabled in your test program, an exception is thrown after which the operator interface crashes.

Workaround:

Do not request a mid-lot summary while alarms are enabled in your test program.

Reported Version:

TestStand Semiconductor Module 2022 Q2

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
2864647

The Limits Reader Gives An Inaccurate Message When A Row Contains Too Few Data Points

If you attempt to import limits from a limits file containing a row with fewer data points than expected, the limits reader will display a message in which the number of data points found is off by a value of plus 1. For example, if your test is expecting ten columns of data where the row in your limits file contains only six data points, the error received will inaccurately state that seven data points were found:

Too few data columns: Expected 10 columns of data, found only 7 columns.

This can be especially confounding if your limits file contains a row which is one data point short of the expected number of data columns. (For example, your row contains nine data points where ten columns of data are expected.)  In this case, the error you receive will read similar to the following:

Too few data columns: Expected 10 columns of data, found only 10 columns.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2024 Q3.1 Patch 1

Added:

Jun 30, 2025
3263889

Slow Response While Updating The Test Table In A Semiconductor Multi Test Step

Users may encounter a slow response while scrolling the test table in a Semiconductor Multi Test step when their test program meets the following criteria:
  • The Pin Map file uses a relative file path
  • Both of the following settings are enabled for the 'Current sequence file directory':
    • The Search Directories setting
    • The 'Search Subdirectories' option
You can check these settings using the TestStand Sequence Editor menus by selecting 'Configure' >> 'Search Directories...'

Workaround:

Users can work around this issue using one of the two methods described below.

Method 1:
Relocate the pin map file to be placed within the same directory as the test program sequence file.

Method 2:
Perform the following steps:
  • From the TestStand Sequence Editor menus, select 'Configure' >> 'Search Directories...'
  • Disable the 'Search Subdirectories' option for 'Current sequence file directory'
  • Click 'OK' to save the settings and close the dialog
  • From the TestStand Sequence Editor menus, select 'Semiconductor Module' >> 'Edit Test Program: <Sequence File Name>...' to open the Test Program Editor
  • Using the Test Program Editor, update the Pin Map File Path and ensure that the updated relative path correctly resolves without errors
  • Click 'OK' to save your changes and close the Test Program Editor

Reported Version:

TestStand Semiconductor Module 2021 Q4

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
3799430

Copying Data To The Clipboard While A Test Is Running May Cause The Runtime Data Viewer To Crash

If a test is running when you click the button to copy your test data to the clipboard, the Runtime Data Viewer may crash depending upon how the results are sorted.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A
3749127

The Runtime Data Viewer 'Summary' Tab Does Not Always Highlight Column Headers In Red When Alarms Are Reported

When the first multi-test step in a sequence is the only step which reports an alarm, the column header is not highlighted in red as expected for columns containing those test results. However, the corresponding cells containing those results do have a red border highlight as expected.

Workaround:

There is currently no known workaround for this issue.

Reported Version:

TestStand Semiconductor Module 2024 Q1

Resolved Version:

TestStand Semiconductor Module 2026 Q1

Added:

N/A

Final Time Issue Listed

Issues found in this section will not be listed in future known issues documents for this product.

There are currently no issues to list.

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Glossary of Terms

 

  • Bug ID - When an issue is reported to NI, you may be given this ID or find it on ni.com.  You may also find IDs posted by NI on the discussion forums or in KnowledgeBase articles.
  • Legacy ID – An older issue ID that refers to the same issue.  You may instead find this issue ID in older known issues documents.
  • Description - A few sentences which describe the problem. The brief description given does not necessarily describe the problem in full detail.
  • Workaround - Possible ways to work around the problem.
  • Reported Version - The earliest version in which the issue was reported.
  • Resolved Version - Version in which the issue was resolved or was no longer applicable. "N/A" indicates that the issue has not been resolved.
  • Date Added - The date the issue was added to the document (not the reported date).