This document contains the NI-Digital Pattern Driver known issues that were discovered before and since the release of NI-Digital Pattern Driver 2024 Q3.1. Known issues are performance issues or technical bugs that NI has acknowledged exist within this version of the product.
Not every issue known to NI appears on this list; it is intended to show the most severe and common issues that you may encounter and provide workarounds when possible. Other technical issues that you may encounter could occur through normal product use or system compatibility issues. You may find more information on these issues in NI’s Product Documentation, Knowledgebase, or Community; see Additional Resources.
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Bug Number |
Legacy ID |
Description |
Details |
|---|---|---|---|
| 1466065 |
Capturing History RAM on a pattern with Scan opcode may not work correctlyWhen using multiple Scan opcodes in a pattern and triggering History RAM on pattern label with a vector offset past the first Scan opcode, History RAM will return 0 samples. Workaround: Configure History RAM to trigger based on cycle offset instead of vector offset. |
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 19.0.1 | NI-Digital Pattern Driver and Digital Pattern Editor 20.6 Resolved Version: N/A Added: Jul 23, 2021 |
|
| 2976055 |
Scan compression does not occur for instruments when no pins are configured as scan pinsWhen loading a pattern that contains a scan vector on an instrument that does not have any mapped scan pins, no scan pattern compression will occur. Workaround: Configure at least one pin as a scan pin on every instrument in the session.
|
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: N/A Added: Apr 3, 2025 |
|
| 2976055 |
Reported memory usage may be inaccurate with multi-instrument sessions when instruments have different numbers of scan pinsWhen loading a pattern in a multi-instrument session where every instrument does not have the same number of scan pins, the reported memory usage in Digital Pattern Editor may be inaccurate. Workaround: Configure the same number of scan pins on every instrument in the session.
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Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: N/A Added: Apr 3, 2025 |
|
| 2795788 |
Digital Scope should constrain compare strobe edge within time-set periodFor patterns with multiple adjacent high frequency cycles, the Digital Scope operation may incorrectly place time-set comparator edges, violating hardware timing limits and resulting in incorrect noisy signals. Workaround: There is currently no known workaround for this issue. |
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: N/A Added: Apr 3, 2025 |
|
| 2902761 |
When using Digital Pattern Editor with an older version of TestStand Semiconductor Module installed, System View may not display live measurementsWhen using Digital Pattern Editor with an older version of TestStand Semiconductor Module installed, System View may not display live measurements. This applies to TestStand Semiconductor Module versions 2024Q1 and earlier.
Workaround: There is currently no known workaround for this issue. |
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: N/A Added: Apr 3, 2025 |
Issues found in this section will not be listed in future known issues documents for this product.
There are currently no issues to list.
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