This document contains the TestStand Semiconductor Module known issues that were discovered before and since the release of TestStand Semiconductor Module 2022 Q2. Known issues are performance issues or technical bugs that NI has acknowledged exist within this version of the product.
Not every issue known to NI appears on this list; it is intended to show the most severe and common issues that you may encounter and provide workarounds when possible. Other technical issues that you may encounter could occur through normal product use or system compatibility issues. You may find more information on these issues in NI’s Product Documentation, Knowledgebase, or Community; see Additional Resources.
|
Bug Number |
Legacy ID |
Description |
Details |
|---|---|---|---|
| 3064832 |
Displaying The Mid-Lot Summary Report Causes The Operator Interface To Crash When Alarms Are EnabledWhen you request a mid-lot summary report and you have alarms enabled in your test program, an exception is thrown after which the operator interface crashes.
Workaround: Do not request a mid-lot summary while alarms are enabled in your test program.
|
Reported Version: TestStand Semiconductor Module 2022 Q2 Resolved Version: TestStand Semiconductor Module 2024 Q3.1 Patch 1 Added: May 13, 2025 |
Issues found in this section will not be listed in future known issues documents for this product.
There are currently no issues to list.
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