This document contains the TestStand Semiconductor Module known issues that were discovered before and since the release of TestStand Semiconductor Module 2021 Q4. Known issues are performance issues or technical bugs that NI has acknowledged exist within this version of the product.
Not every issue known to NI appears on this list; it is intended to show the most severe and common issues that you may encounter and provide workarounds when possible. Other technical issues that you may encounter could occur through normal product use or system compatibility issues. You may find more information on these issues in NI’s Product Documentation, Knowledgebase, or Community.
|
Bug Number |
Legacy ID |
Description |
Details |
|---|---|---|---|
| 3263889 |
Slow Response While Updating The Test Table In A Semiconductor Multi Test StepUsers may encounter a slow response while scrolling the test table in a Semiconductor Multi Test step when their test program meets the following criteria:
Workaround: Users can work around this issue using one of the two methods described below.
Method 1: Relocate the pin map file to be placed within the same directory as the test program sequence file. Method 2:
Perform the following steps:
|
Reported Version: TestStand Semiconductor Module 2021 Q4 Resolved Version: TestStand Semiconductor Module 2026 Q1 Added: N/A |
Issues found in this section will not be listed in future known issues documents for this product.
There are currently no issues to list.
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