Test Code Module Development with STS and .NET/C# Course Overview

The Test Code Module Development with STS and .NET/C# Course will follow the typical customer workflow and milestones, which includes tight interaction with corresponding hardware. After completing this course, a test developer will be able to use Semiconductor Test System (STS) resources to develop and debug measurement code modules for STS test program, to create custom test steps, to perform test program optimization and deployment.

Available formats

 

Virtual Training

 

Classroom Training

 

Private Classes

Course Objectives

Course Details

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Audience

Prerequisites

NI Products Used

Training Materials

Cost in Credits

Test Code Module Development with STS and .NET/C# Course Outline

LessonOverviewTopics

Overview of NI STS Software 

Explore the different types of software and environments used to configure and develop test programs for the STS. 

 

  • NI STS Software Overview 
  • Switching Between Versions of STS Software 

Exploring STS Code Development Resources 

Identify the resources available to help get started with developing test code modules for STS. 

  • Semiconductor Module Context and TSM API Overview 
  • Introduction to the Semiconductor Test Library (.NET/C#) 
  • Exploring the Project Creation Templates 
  • Exploring the Help Files 

 

Programming Instruments of the STS 

Programmatically control and configure the instruments of the STS. 

  • Instrument Programming Overview 
  • Programming DCPower Instruments in STS 
  • Programming Digital Pattern Instruments in STS 
  • Exploring the Use of Other Instruments in STS 
  • Building Your Code Modules 

Running Code Modules as Part of a Test Program 

Explore techniques for ensuring the quality of the test code modules, sorting DUTs based on test code results, and using test system information within the code modules. 

  • Communicating with a DUT 
  • Debugging the Test Program 
  • Performing Inline Quality Assurance Testing 
  • Assigning Software Bins to a DUT 
  • Getting and Storing Test Information 

Developing a Multisite Test Program for STS 

Use the batch process model to modify a test program for multisite execution. 

  • Executing Tests Using the Batch Process Model 
  • Developing Test Programs for Multisite Execution 

Reducing STS Test Time 

Use various tools and techniques to reduce test time and verify timing using both high-level test system benchmarking and low-level test step benchmarking. 

  • Exploring Test Time Reduction Techniques 
  • Benchmarking a Test System 
  • Low-Level Test Step Benchmarking 

Deploying an STS Test Program 

Define a deployment process, deploy the test program, and debug it after deployment. 

  • Deploying a Test Program 
  • Debugging Deployed Test Programs 

Continue Your Learning Path

Closeup of a circuit board

 

RF IC Test with STS and .NET/C#

 

For test engineers testing RF parts, use STS RF resources interactively to create, modify, execute, and debug test programs based on RF configurations.

 

mmWave Test with STS (.NET/C#)

 

For test engineers testing mmWave parts, learn about the components, functionality, and purpose of the mmWave subsystem.

 

Device Testing with Digital Pattern Instruments

Leverage digital pattern instruments and the Digital Pattern Editor to perform common characterization and production tests, with a focus on DUT communication, digital interface testing, and continuity and leakage testing.

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