Integrating the VCSEL I-V Test Subsystem Course Overview

The VCSEL I-V Test Subsystem provides a customizable solution for testing vertical-cavity surface-emitting laser (VCSEL) devices. In this course, students will learn how to integrate the VCSEL I-V Test Subsystem into their existing test systems and perform basic tests to ensure proper connectivity.

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Available formats

On-Demand

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Course Objectives

Describe the high-level purpose of the VCSEL I-V Test Subsystem and locate the available resources to assist with integration into a larger test system
Integrate the VCSEL I-V Test Subsystem with the other hardware components of an existing test system
Describe the software components that are installed as part of the VCSEL I-V Test Software
Use example VIs in LabVIEW to generate compensation data, which ensures accurate I-V measurements during test execution
Measure the pulse voltage (V) and pulse current (I) across a VCSEL DUT so that you can characterize the DUT performance
Use the VCSEL Test Result Viewer example project, accessible from the NI Example Finder, to explore any issues in the test results of your I-V measurement
Debug and troubleshoot the common issues that arise with system configuration, system operation, and test program execution

Course Details

Duration

On-Demand: 2 hours

Audience

System integrators responsible for creating test solutions for VCSEL production customers

Prerequisites

LabVIEW Core 2 or equivalent

NI Products Used

VCSEL I-V Test Software 20.0
NI VCSEL I-V Test Subsystem

Training Materials

On-demand training includes digital course materials delivered through the NI Learning Center, available for the access duration of your subscription

Cost in Credits

On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits

Integrating the VCSEL I-V Test Subsystem Course Outline

Lesson	Overview	Topics
Introduction to the VCSEL I-V Test Subsystem	Describe the high-level purpose of the VCSEL I-V Test Subsystem and locate the available resources to assist with integration into a larger test system.	What Is the NI VCSEL I-V Test Subsystem? Additional Learning Materials
Integrating the VCSEL Hardware into a Test System	Integrate the VCSEL I-V Test Subsystem with the other hardware components of an existing test system.	Exploring the Hardware Components of a VCSEL I-V Test Subsystem Choosing a Hardware Configuring Option Designing Your Load Board Getting Started with Using the VCSEL I-V Test Subsystem Maintaining Your Hardware
Exploring the VCSEL I-V Test Software	Describe the software components that are installed as part of the VCSEL I-V Test Software.	Installing the VCSEL I-V Test Software Exploring the LabVIEW Shipping Examples Creating Customized Code Modules
Generating Compensation Data	Use example VIs in LabVIEW to generate compensation data, which ensures accurate I-V measurements during test execution.	What Is Compensation Data? Performing System Compensation Performing Pulse Compensation
Performing I-V Measurements	Measure the pulse voltage (V) and pulse current (I) across a VCSEL DUT so that you can characterize the DUT performance.	Preparing to Take an I-V Measurements Performing an I-V Measurements Comparing Performance of Serial and Parallel Execution
Viewing the Test Results	Use the VCSEL Test Result Viewer example project, accessible from the NI Example Finder, to explore any issues in the test results of your I-V measurement.	When to Use the Test Result Viewer Viewing the Test Results
Troubleshooting Common Issues	Debug and troubleshoot the common issues that arise with system configuration, system operation, and test program execution.	Troubleshooting System Configuration Issues Troubleshooting System Operation Issues Troubleshooting Test Program Issues

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