RF Measurement Fundamentals

The power amplifier (PA)—as either a discrete component or part of an integrated front-end module (FEM)—is one of the most integral components in modern radios. In this application note, learn the basics of testing RF PAs and FEMs through an interactive application note with multiple how-to videos.

To address linearity and efficiency requirements, engineers frequently use techniques such as digital predistortion (DPD) to improve linearity and use dynamic power supply (DPS) techniques, such as envelope tracking (ET). Learn how to implement these techniques for optimized PA validation.

Error vector magnitude (EVM) is an important measurement in wireless communications, and the various factors that affect EVM must be considered to obtain accurate results. Learn more about EVM measurement techniques and leverage this knowledge to optimize EVM measurements using NI PXI VSTs.

Non-linearity measurements such as TOI, P1dB, and P3dB, can be made difficult with the various techniques that can be used and how those techniques impact results. Learn about the pros and cons of each method, and how to configure the test system best suited for a given application.

Harmonics are an important RF characterization metric in part due to their interactions with other wireless systems. Learn how NI VSTs offer a superior alternative to the measurement of harmonic signals with VSAs and HMUs. Discover how VSTs empower test engineers and optimize their RF testing process.

Validation of high-power PAs can differ from PAs operating at lower power levels in system setup and test methodology. This application note covers best practices and considerations unique to high-power PA test and features NI solutions that help optimize validation of these components.

VNAs characterize high-frequency passive and active devices in their linear mode of operation by measuring their network parameters, called S-parameters, as a function of frequency. Learn about network analyzer measurement basics in this comprehensive application note.

Noise is a noticeable phenomenon in RF applications. Dealing with noise requires dealing with statistics, probability distribution functions, and proper measurement methodologies. Learn about the generation of noise, and the measurement and calculation of noise figure.

Noise figure is a critical parameter in characterization for many RF components. Learn how to configure Y-factor noise figure measurements using NI’s synthetic noise source (SNS) in the PXIe-5842 Vector Signal Transceiver.

Cross-correlation is a technique in which two signal analyzers are used to measure EVM, achieving results approximately 3 dB better than a single instrument can provide. In this application note, learn more about NI’s industry-leading EVM performance using cross-correlation.

Learn about non-terrestrial networks: from the specifications used, such as 5G NR and LTE, to the optimized test techniques that ensure proper performance and compliance. Discover how to automate and build custom test environments for NTN components and devices.

Test of GaN PAs requires many unique test considerations, due to their wide bandgap properties. This application note shares key characterization techniques like time domain synchronization and system calibration to enhance efficiency and performance under diverse conditions.

Explore how to utilize various personalities of NI RFmx software to take physical layer measurements required by Zigbee and Thread specifications. This application note introduces high-level solutions that meet the PHY of the OSI model requirements.

Learn how to configure, calibrate, and acquire measurements for UWB devices over the air (OTA). Explore the details of how to optimize these test applications and ensure accurate and reliable test results for complex measurements such as time of flight (ToF) and angle of arrival (AoA).