NI and Shanghai University Collaborate on a 5G Ultra-Reliable Low-Latency Testbed for V2X Communications

January 30, 2018 - NI is collaborating with Shanghai University on a testbed focused on 5G ultra-reliable low-latency communications (URLLC) for V2X applications.

https://www.ni.com/en-us/about-ni/newsroom/news-releases/ni-and-shanghai-university-collaborate-a-5g-ultra-reliable-low-latency-testbed-for-v2x-communications.html
Test Smarter With the Latest Enhancements to LabVIEW NXG

January 23, 2018 - LabVIEW NXG introduces key functionality for engineers developing and deploying automated test and measurement systems.

https://www.ni.com/en-us/about-ni/newsroom/news-releases/test-smarter-with-the-latest-enhancements-to-labview-nxg.html
NI’s New Semiconductor Power & Performance Validation Solution Simplifies Path to More Power Efficient ICs

January 23, 2018 - Accelerate design feedback and time to market with a standard solution for power consumption measurements

https://www.ni.com/en-us/about-ni/newsroom/news-releases/ni-new-semiconductor-power---performance-validation-solution.html
NI Improves PXI SMU Channel Density for the Semiconductor Test System by 6X

January 16, 2018 - New PXIe-4163 high density SMU provides six times more DC channel density than previous NI PXI SMUs.

https://www.ni.com/en-us/about-ni/newsroom/news-releases/ni-improves-pxi-smu-channel-density-for-the-semiconductor-test-system-by-6x.html
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