This document focuses on two types of solid-state cameras available today: CCD and Complementary Metal Oxide Semiconductor (CMOS).

Led by the Naval Air Systems Command and ATE industry members, ATML is a cooperative effort to define a collection of XML schemas to represent test information, such as test programs, test asset interoperability, ...

This tutorial introduces and explains the basic fundamentals of analog circuits.

Measurement system power is key to characterizing product performance, analyzing system response, and detecting defects. National Instruments high-speed digitizers deliver improved time and frequency measurements ...

A parallel test station typically shares a set of test equipment across multiple test sockets, but, in some cases, it may have a separate set of hardware for each unit under test (UUT). With parallel testing, ...

Arbitrary waveform generators such as the NI 5421, which are based on the NI Synchronization and Memory Core (SMC) architecture, offer several benefits for generating baseband I/Q signals for both the ...

NI real-time hardware and software work together seamlessly to run applications reliably and deterministically with precise timing. This paper explains the different components you need to create an NI ...

Home Innovations White Paper How to Choose the Right Bus for Your Measurement System Updated Jan 26, 2021 Overview When you have hundreds of different data acquisition (DAQ) devices to choose from on a ...

This paper outlines the similarities in functionality of C and LabVIEW and how to use these standard programming structures and methods.

Maximizing the battery life of new devices is one of the biggest challenges design engineers face, so it’s not surprising that they now spend a significant portion of their design effort testing and characterizing ...

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