Semiconductor

Designing and developing a revolutionary XYZ measurement-based inspection technology to help companies improve the quality of their manufactured PCB assemblies.

Creating a flexible, cost-effective ferroelectric RAM (F-RAM) memory test system as an alternative to existing automated test equipment (ATE) for functional verification of new products and quick diagnosis ...

Creating an instrument that can control and measure the movement of multiple MEMS resonator structures to execute quasi-static and fatigue break tests.

Performing die tests prior to stacking 3D ICs to achieve sufficient compound stack yield by probing the interconnect microbumps for pre-bond test access.

Increasing wafer probe test throughput and improving tester flexibility for use with various semiconductor sensors.

Keeping wireless local area network (WLAN) test costs low and test accuracy high while reducing characterization times as device complexity grows by tracking an increasing number of wireless standards. ...

Implementing a global semiconductor validation test strategy to improve test consistency, test coverage, and quality of statistical analysis to decrease the time to market and the effective time spend ...

PDF Solutions needed to build a control system for a scanning electron microscope (SEM) to acquire images with nanometer alignment and autofocus, while integrating the software with an external .NET application. ...

Providing testing companies with more test channels, reduced test time, and improved performance so equipment manufacturers can meet the industrial demand for microelectromechanical sensors (MEMS).

Replacing existing benchtop equipment with a fully automatic measurement system to accurately characterize analog-to-digital converters (ADCs) to improve quality, reduce costs, and shorten test development ...

Designing an automated test system for functional and parametric control of static and dynamic parameters of high-power IGBT and MOSFET transistors.

Developing a system for automated testing of peripheral software that does not require considerable investment into a specialized test hardware infrastructure and does not require continuous upgrading ...

Identifying a cost effective solution for performing fixture test and repair in line with manufacturing flow that requires minimum overhead and does not affect ATE productivity.

Reducing the test time, test system footprint, and overall cost for final-stage wafer- level testing of microelectromechanical systems (MEMs) inertial sensors while maintaining measurement quality.

Designing and implementing a custom functional test system for producing many types of semiconductor hybrids. The system should provide a flexible test architecture, easy-to-use development environment, ...

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