Semiconductor

Designing and developing a revolutionary XYZ measurement-based inspection technology to help companies improve the quality of their manufactured PCB assemblies.

PDF Solutions needed to build a control system for a scanning electron microscope (SEM) to acquire images with nanometer alignment and autofocus, while integrating the software with an external .NET application. ...

Replacing existing benchtop equipment with a fully automatic measurement system to accurately characterize analog-to-digital converters (ADCs) to improve quality, reduce costs, and shorten test development ...

Designing an automated test system for functional and parametric control of static and dynamic parameters of high-power IGBT and MOSFET transistors.

Developing a system for automated testing of peripheral software that does not require considerable investment into a specialized test hardware infrastructure and does not require continuous upgrading ...

Providing testing companies with more test channels, reduced test time, and improved performance so equipment manufacturers can meet the industrial demand for microelectromechanical sensors (MEMS).

Identifying a cost effective solution for performing fixture test and repair in line with manufacturing flow that requires minimum overhead and does not affect ATE productivity.

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