Semiconductor

Designing and implementing a custom functional test system for producing many types of semiconductor hybrids. The system should provide a flexible test architecture, easy-to-use development environment, ...

Developing a high-end, scalable, and cost-effective mixed-signal automated test equipment (ATE) production tester that enables wafer sort and final test for ON Semiconductor’s new generation image sensors. ...

Increasing wafer probe test throughput and improving tester flexibility for use with various semiconductor sensors.

Keeping wireless local area network (WLAN) test costs low and test accuracy high while reducing characterization times as device complexity grows by tracking an increasing number of wireless standards. ...

Creating a system to localize failure mechanisms causing abnormal electrical behavior, including those linked to complex parameters (such as frequencies, amplitudes, and digital values contained in registers), ...

NewPath Research needed to develop a system for non-destructive, high-resolution carrier profiling with sub-nm resolution to support the semiconductor industry as it progresses to the new sub-10 nm lithography ...

Developing a modular test solution that is abstract, scalable, modular, and easy to use; supports test sequencing across hundreds of power management ICs (PMIC); and interacts with multiple instruments, ...

Performing die tests prior to stacking 3D ICs to achieve sufficient compound stack yield by probing the interconnect microbumps for pre-bond test access.

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