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We’re Here to Help – Let’s Overcome Your Test Challenges

At NI, we care deeply about your success! That’s why we’ve brought product demonstrations and key industry information to you digitally. Use these resources to learn, connect and engage with NI while large events continue to be cancelled throughout the world.

Let’s Advance Your Project

Our experts are continuing to work during these uncertain times, and we want to help you with anything you need. You need a smarter alternative to traditional automated test equipment (ATE) to meet cost and coverage requirements of increasingly complex RF and mixed-signal ICs. Discover how NI test solutions can scale from the lab to the production floor and meet your business needs.

Find A Smarter Approach to Production ATE

Chipmakers must deliver more integrated functionality, ensure the highest reliability for mission-critical applications, remain highly cost competitive, and ensure a short time to market to meet tight market windows. Consolidation has left the semiconductor ATE market with fewer suppliers, leading to limited options. We think it's time for a change.

5G Device Test Video

NI is working with leading chip makers to deliver a solution for 5G test.

Innovations With Wideband 5G Device Test

With new bands, wider bandwidth, and new beamforming technology, 5G presents significant design and test challenges that might seem daunting—but NI is here to help.

Smarter Alternative for Semiconductor Production Test

Optimized for throughput and cost, STS is a production-ready ATE solution for RF, mixed-signal, and MEMS semiconductor devices. To complete the solution, NI offers comprehensive engineering services, bring-up services, training, and support.


5G mmWave Semiconductor Device Test

Test engineers working on wideband 5G devices require accurate, fast, and cost-effective test solutions to ensure the reliability of new chip designs. Learn about the top test challenges and solutions for wideband 5G IC test.

Have questions? Contact us about your project needs.