Test Engineers involved in creating automated V&V or functional test systems need the flexibility to quickly prototype and debug their test code during test system development. In both the test creation and test deployment stages the ability to debug the test code is very crucial to successfully building a test system.
Figure 1 : Typical Test Development and Deployment Flow
With PXI based automated test systems, engineers experienced multitudes of improvement in test time, test system development and management. NI Soft Front Panels (SFP) presented a familiar experience for interacting with modular instruments but the debugging experience continued to remain a challenge due to the inability of the SFPs to run concurrently with automated test code.
The NI Debug Driver Session technology now brings the familiar box instrument debugging experience to the modular instruments with several additional productivity enhancement features that will allow test developers to program their test systems with enormous flexibility.
The Debug Driver Session technology allows the test developers to make use of soft front panels when instruments are being accessed by LabVIEW or TestStand or other ADEs to perform concurrent run-time monitoring of the instruments or take control and make changes to the instrument settings. The technology also provides several advantages over the traditional box debugging experience.
Following sections of this white paper describe this capability and how to use it.