From Friday, April 19th (11:00 PM CDT) through Saturday, April 20th (2:00 PM CDT), 2024, ni.com will undergo system upgrades that may result in temporary service interruption.

We appreciate your patience as we improve our online experience.

Test Program Development with STS and LabVIEW Course

The Test Program Development with STS and LabVIEW Course delivers hands-on training for setting up and using a Semiconductor Test System (STS) to communicate with a device under test (DUT). The course will follow the typical semiconductor test workflow and milestones, which includes tight interaction with corresponding hardware. After completing this course, a test engineer will be able to use STS tester resources interactively to create, modify, execute, and debug test programs with pre-existing code modules to collect test data and test time reports.

Course Details:

Test Program Development with STS and LabVIEW Course Outline

LessonOverviewTopics
System OverviewThis lesson introduces the NI Semiconductor Test System (STS).
  • Introduction
  • System overview
  • Safety requirements and specifications
Exploring NI STS InstrumentationThis lesson introduces the STS instrumentation and resources, their specifications, functionalities and purposes.
  • Recognizing tester instrumentation and resources
  • Exploring system specifications
  • Identifying STS Instrumentation
  • Calibration in STS
Create STS ProjectThis lesson explains how to use the Create STS Project Tool.
  • What is the create sts project tool?
  • Exploring created files
Mapping STS Hardware to DUT PinsThis lesson covers how to create and modify a pin map.
  • What is a pin map?
  • Reviewing tester configuration and load board schematics
  • Mapping measurement requirements
  • Modifying the pin map
Exploring the Digital Pattern InstrumentThis lesson covers how to perform DUT control and digital tests using the Digital Pattern Editor.
  • Exploring the architecture and features of digital pattern instrument
  • Using the digital pattern editor
Validating DUT BehaviorThis lesson covers how to bring-up the device, interactively control tester resources, and implement simple tests.
  • Using Device Interface Board to interface with the DUT
  • Checking continuity and measuring leakage current
  • DUT bring-up
Creating and Bursting Digital PatternsThis lesson illustrates how to create, load, and burst basic digital patterns.
  • Learning vector - based patterns
  • Creating basic digital patterns to communicate with the DUT
  • Converting digital patterns
Exploring the STS Software Development EnvironmentThis lesson teaches how to add steps to the test sequence or call a prewritten code module.
  • Exploring the test sequence file
  • Adding steps to a test sequence
  • Creating test steps
  • Configuring step settings
  • Configuration based templates versus custom code modules
  • Controlling TestStand execution
Configuring Test Program and StepsThis lesson explains test step templates and how to modify test limits, configure binning, execute test program, and report the results.
  • Using step templates
  • Setting test limits
  • Creating test configurations
  • Binning
  • Executing a test program in the test development environment
  • Understanding test results and reporting
DebuggingThis lesson covers how to debug devices, signals, and the test sequence.
  • Test program debugging
  • Debugging scenarios
  • Benchmarking test time
  • Using the InstrumentStudio for debugging
  • Using the digital pattern editor for debugging
Using the STS Operator InterfaceThis lesson covers how to run a test program in the operator interface (OI) and acquire socket time.
  • Exploring the OI features
  • Configure stations and lot settings from the OI
  • Running a test sequence from the OI
  • OI indicators, fields, and functions
  • Viewing test results and reports

Get started with Test Program Development with STS and LabVIEW today