Filtered Results

Refer to the List of Bugs Fixed in NI TestStand 2017 Semiconductor Module on the NI website for a list of bugs fixed in NI TestStand 2017 Semiconductor Module.

The following list describes the new features in the NI TestStand 2019 Semiconductor Module (TSM) and other changes since the NI TestStand 2017 Semiconductor Module.

TSM calls the GetStationSettings callback sequence to programmatically obtain station settings without requiring much, if any, test engineer or technician interaction when execution begins.

Use TestStand and TSM with other NI development tools to build, debug, customize, and deploy semiconductor characterization and production test systems.

A semiconductor test program can include a pin map file, a main sequence file, subordinate sequence files, code modules, specifications, timing files, levels files, pattern files, source and capture waveforms, ...

Use the Configure entry point to provide a mechanism for end users to configure the handler/prober driver and to persist the settings for multiple lots.

When you perform multisite testing, you can improve performance by simultaneously testing multiple sites using multiple execution threads. When you use the TestStand Batch process model to test multiple ...

It is common to add a settling time before taking measurements to achieve the required precision. Once a test program is running well, evaluate the settling times to reduce them to the minimum settling ...

Depending on the number of sites a test program tests, the number of pins in the pin map, the number of independent instrument resources on the tester, and the number of logical processors on the tester, ...

A semiconductor test program must communicate information from the tester instrumentation to the DUT to which the instrumentation is connected. To handle this communication in a test program, test engineers ...

The pin map XML schema, located at \Components\Schemas\NI_SemiconductorModule\PinMap.xsd, defines the following structure for a pin map XML file:

Skip to Content Bookmarks Watch List Search Preferences Log in TestStand 2020 Semiconductor Module 2021 Q4 TestStand Semiconductor Module Help Tags: Feature Usage TestStand 2020 Semiconductor Module 2021 ...

Use the Pin Map Editor to view, create, modify, and save pin map files instead of editing the XML files directly. Use the Pin Map panel in the Test Program Editor to specify a pin map file for a test

Use the Connections table on the Pin Map tab to view and edit connections and connection attributes. The Connections table includes a row for every possible connection that can be made with the available ...

Use the Instruments section on the Pin Map tab to specify the type of instruments required to execute the test program and the name and attributes of each instrument. You can right–click any item in the ...

Use the Pins section on the Pin Map tab to specify the DUT pins and other pin types connected to the tester. You can right–click any item in the section you want to edit and use the context menu to

Showing 1-20 of 1385 results
1 of 70 pages