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The NI TestStand 2012 R2 Semiconductor Module introduces new features. Some compatibility issues might exist as a result of changes in the NI TestStand 2012 R2 Semiconductor Module.

The following list describes the new features in the NI TestStand 2016 SP1 Semiconductor Module (TSM) and other changes since the NI TestStand 2016 Semiconductor Module.

Refer to the List of Known Issues in NI TestStand 2017 Semiconductor Module on the NI website for a list of known issues in NI TestStand 2017 Semiconductor Module (TSM).

Use TestStand and TSM with other NI development tools to build, debug, customize, and deploy semiconductor characterization and production test systems.

Because LabVIEW operates on a data flow model and TestStand generates events, updating the state of execution while handling events might become a complex task. However, the Semiconductor Module Manager ...

Part average testing (PAT) is a method based on statistical analysis to identify and fail parts that have characteristics significantly outside the normal distribution of other parts in the same lot. The ...

Use the example PAT plug-in, located in the \Examples\NI_SemiconductorModule\Part Average Testing\Example Part Average Testing Plug-In directory, as a starting point for custom PAT plug-ins ...

Use the part average testing (PAT) Customize entry point to customize PAT tests before the PAT tests execute on a site. TSM calls this entry point when the MainSequence sequence finishes executing for ...

Use the part average testing (PAT) Perform entry point to perform the PAT tests after all the tests in the MainSequence sequence have executed on a site. TSM calls this entry point when the MainSequence ...

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