To be affected by this issue, a test system must meet the following conditions:
1. Using NI-Digital Pattern Driver version 17.1, 17.1.1, or 17.5
2. Using multiple PXIe-6570 digital pattern instruments in the same PXI chassis
3. Using the NI-TClk API to synchronize multiple digital pattern instruments, independent of the programming language used.
4. Not setting the Timing Absolute Delay property to Enabled (the default value is Disabled)
NI Semiconductor Test Systems (STS) use preconfigured software bundles which never included versions 17.1, 17.1.1, or 17.5 of the NI-Digital Pattern Driver. However, if the system has been manually upgraded to 17.1, 17.1.1, or 17.5 users should evaluate the above conditions to determine if their system is affected by this issue.