Semiconductor technology requirements often outpace the test coverage that traditional approaches offer for analog, mixed-signal, and RF test. Semiconductor test engineers need smarter solutions that address cost, scalability, design, and device challenges.
Flexible Semiconductor Test Solutions
As the devices we use get smarter, they become more software centric, and the semiconductor industry that is powering these smart devices is going through a transformation not only in how the ICs are designed and manufactured but also in how they are tested. Regardless of the type of smart device, the business drivers are the same. IC makers must deliver more integrated functionality, ensure the highest reliability for mission-critical applications, remain highly cost competitive, and ensure a short time to market to meet tight design windows. NI delivers smarter test solutions that scale from the lab to the production floor and meet the business needs of IC manufacturers.
PXI with source measurement units enable development of highly parallel measurement system that reduces wafer loss and costs, and allows faster adjustments to the semiconductor process flow.
5 Challenges of Wideband 5G Device Test
Designers and test engineers working on wideband 5G devices require accurate, fast, and cost-effective test solutions to ensure the reliability of new chip designs. Learn about the top test challenges and solutions for wideband 5G IC test.
5 Best Practices for Maximizing DC Measurement Performance
Whether you are testing power management ICs or RF power amplifiers, taking quality DC measurements is a cornerstone of testing semiconductor chips. Improve measurement accuracy and product quality by applying these foundational best practices.