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Home Solutions Aerospace and Defense Electrical and Mechanical Systems Test Electronic Systems Test Reduce Time and Complexity Testing Modern EO/IR Imaging Systems

Reduce Time and Complexity Testing Modern EO/IR Imaging Systems

Focal plane array (FPA) systems are used across all operational domains for weather forecasting, safety, ISR, tactical defense systems, and more. FPA engineers design for increased imaging system performance with high resolution, reliability, and sensitivity. To deliver on time and within budget, engineers must find efficient ways to design, test, and adapt to requirements balancing the need to customize and the desire to standardize. The following are a few challenges that FPA test engineers face:

 

  • Reduce program deployment timelines with flexible standardized test solutions
  • Test a wide range of I/O types and devices with a common tester
  • Customizable interface protocols for modern EO/IR readout IC (ROIC) technology
  • Enable parallel subsystem development and test before and after integration into Dewar-Cooler assemblies (IDCA)
  • Deliver testing capability from parametric to full system-level validatio

EO/IR Imaging Detector Systems Test Solution

  • Cover all I/O and measurement types in a single system with a software-connected test system with PXI Express, LabVIEW, and TestStand
  • Support for common data and control interfaces: RS422, SpaceWire, MIL-STD-1554, Serial RapidIO® (SRIO), XAUI, Aurora, 10 GbE, and more
  • Precision test for high-sensitivity FPA bias interfaces with PXI Express SMU technology
  • Customized FPGA capability for customized ROIC interfaces with high-speed serial instruments using LabVIEW FPGA

Solution Advantages

  • Uses a common platform to improve test engineering team efficiency with IP and best practice reuse

  • Reduces obsolescence and maintenance challenges of custom test systems designed on FPGA evaluation boards

  • Eliminates redesigning testers from scratch for every program with a standardized platform to scale with flexible, open, and modular instrumentation

  • Consolidates your test system under a single hardware and software solution

  • Addresses the full range of test requirements from parametric measurements to full system-level validation

Viewpoint Systems’ AEDIS FPA Test Architecture

Modern FPA Test Systems

Viewpoint Systems uses NI’s flexible and modular instruments for FPA data interface emulation and data interface capture capabilities. The AEDIS architecture adapts to your custom requirements while reducing development time with pre-built components common to many EO/IR testers.

BUILD YOUR SOLUTION WITH THE NI ECOSYSTEM

NI offers a variety of solution integration options customized to your application-specific requirements. You can use your own internal integration teams for full system control or leverage the expertise of NI and our worldwide NI Partner Network to obtain a turnkey solution.

Viewpoint Systems

Consult with Viewpoint Systems, a leading expert in EO/IR FPA systems test. Viewpoint Systems’ Aedis platform is an FPA emulation and acquisition system for testing high-bandwidth, high-channel imaging subsystems. With more than 25 years of NI technology experience, Viewpoint Systems can help configure and develop your ideal FPA testing solution.

Services and Support

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An NI Partner is a business entity independent from NI and has no agency or joint-venture relationship and does not form part of any business associations with NI.