From 8:00 PM Friday, July 23 - 7:00 PM CDT Saturday, July 24, will be undergoing system upgrades that may result in temporary service interruption.

We appreciate your patience as we improve our online experience.

Test Program Development with STS and .NET/C# Course Overview

The Test Program Development with STS and .NET/C# course delivers hands-on training for setting up and using an STS to communicate with a device under the test. The course will follow the typical customer workflow and milestones, which includes tight interaction with corresponding hardware. After completing this course, a test engineer will be able to use STS tester resources interactively to create, modify, execute, and debug test programs with pre-existing .NET/C# code modules to collect test data and test time reports.

Course Details:

Test Program Development with STS and .NET/C# Course Outline

Lesson Overview Topics

Introduction to the STS

Explore the main concepts of the Semiconductor Test System (STS).

  • Introduction to the STS Platform

Exploring the Test Head

Explore the high-level features and I/O for the STS test head.

  • Overview of the STS Test Head
  • Exploring the STS T1 M2 Inputs and Outputs

Exploring Load Boards

Explore the high-level features of the device interface board (DIB) and the different load board interface types.

  • Overview of Load Boards
  • Exploring Load Board Interface Types
  • Connecting a DIB to the STS

Docking and Interfacing with the STS

Describe the topology of a typical test cell and explore several options for docking an STS.

  • NI STS Standard Docking and Interfacing
  • Automated Docking Example

Exploring the NI STS Software

Explore the software you use to monitor, maintain, debug, and calibrate the STS. Explore the test development and code module development environment for STS.

  • Overview of the STS Software​
  • Introduction to the STS Maintenance Software​
  • Introduction to the Test Development Environment​
  • Introduction to the Operator Interface

Navigating the Test Developer Workflow

Explore a sample test developer workflow and describe its key steps.

  • Exploring a Sample Test Developer Workflow

Investigating STS Safety Requirements and Specifications

Explore and apply the Safety Requirements and Specifications, Safety Compliance, and Environmental Specifications of the STS system.

  • Exploring the Safety Requirements of the STS​
  • Ensuring the Safety Compliance for the STS​
  • Exploring the Environmental Specifications for the STS

Exploring Tester Instrumentation​

Explore the STS PXI Platform and common STS instrumentation.

  • Exploring the NI PXI Platform​
  • Identifying STS Instrumentation​
  • Additional Common STS Instrumentation​
  • Using Simulated Hardware

Exploring System Specifications

Explore the STS T1, T2, and T4 input and output specifications.

  • Exploring STS System Specifications
  • Exploring STS Specifications Online

Calibrating an STS

Explore the calibration modules and the types of calibration used in the STS system.

  • What is Calibration?
  • Navigating Types of STS Calibration
  • Exploring Calibration Modules Used in STS
  • Enabling Warm-Up Wait Time for STS
  • Checking DC Continuity / Functionality

Creating an STS Project

Create a test program and explore the sequence file and folder structure that are created for the test program.

  • Creating a Test Program
  • Exploring the Folder Structure
  • Exploring the Test Program Architecture

Exploring Pin Maps

Explore the purpose of the Pin Map and its role in mapping STS hardware to DUT pins.

  • What is a Pin Map?​
  • Exploring Information in a Pin Map​
  • Discuss Documentation Needed to Create a Pin Map

Reviewing a Tester Configuration and Load Board Schematic

Explore standard tester documentation, their content, and purpose.

  • Exploring the DUT Specifications​
  • Tracing a Signal from the Instrument to the DUT

Mapping Measurement Requirements

Map measurement requirements to ensure that the system and its equipped instruments can meet the measurement requirements in the Test Plan.

  • Mapping Measurement Requirements​
  • Connecting Instrumentation to DUT Pins​
  • Assigning Tester Resources Based on a Test Plan

Mapping DUT Pins to Instrument Channels

Use the Pin Map Editor to create and modify pin map files, which map DUT pins to instrument channels.

  • Adding and Configuring an Instrument Using the Pin Map Editor​
  • Reviewing Pin Map Errors and Warnings​
  • Setting Up Multi-Instrument Sessions

Interfacing with the DUT using the Device Interface Board

Describe the different ways that you can connect your instruments to a DIB and identify the resources available to assist with designing your own load board.

  • How Do I Connect My DIB to My Instruments?​
  • How Do I Design My DIB?​
  • Interfacing the DUT to the DIB

Checking DUT Continuity

Use the digital pattern instrument to test the DUT for continuity prior to running other tests.

  • What Is a Continuity Test?​
  • What Instrument Do I Use to Check the Continuity of the DUT?​
  • Performing a Continuity Test

Bringing Up the DUT

Use the Digital Pattern Editor to bring up the device under test (DUT) so that you can begin testing it.

  • Determining How to Power Up the DUT​
  • Powering Up the DUT

Measuring Leakage Current

Use the digital pattern instrument to measure leakage current for the DUT prior to running other tests.

  • What Is the First Test to Run After Bring-Up?​
  • Performing a Leakage Current Test

Preparing to Communicate with the DUT

Identify the file types associated with a digital project and describe the files that should be created prior to creating a digital pattern to communicate with the DUT.

  • Exploring the Contents of a Digital Project​
  • Creating Specifications Sheets​
  • Creating Levels Sheets​
  • Creating Timing Sheets

Creating Basic Digital Patterns to Communicate with the DUT

Create, edit, load, and burst basic digital patterns to communicate with the DUT using the Digital Pattern Editor.

  • Exploring Vector-Based Patterns​
  • Creating Digital Patterns

Converting Existing Digital Patterns

Convert patterns developed in other environments for use in the Digital Pattern Editor.

  • Converting Existing Pattern Files​
  • Demonstration: Converting an Existing File

Exploring the Test Sequence File

Explore the main components of a test sequence file and how to use each component.​

  • What Are the Components of a Sequence File?​
  • Identifying Panes in the Sequence File Window​
  • Exploring the Test Program Architecture

Adding Steps to a Test Sequence​

Learn how to insert steps to a test sequence.​

  • Adding a Step to a Sequence​
  • Exploring the Step Types​
  • Configuring a Step

Creating and Configuring Test Steps​

In an STS project, create and configure test steps that call code modules.​

  • What Is a Code Module?​
  • Choosing a Starting Point for Semiconductor Test Steps​
  • Calling a TSM Test Step Templates​
  • Calling a Semiconductor Multi Test/Action Step​
  • Configuring Test Step Settings

Using Test Step Templates​

Describe the different step templates that are available and how to use them as part of a test sequence.​

  • Creating a Test Sequence using Step Templates

Controlling TestStand Execution​

Execute a test sequence and modify the test sequence to execute differently depending on the test conditions or settings.​

  • Executing a Test Sequence​
  • Managing and Sharing Data​
  • Using Flow Control Steps to Change the Execution Flow​
  • Using Expressions to Access or Modify Data​
  • Changing Execution Based on a Test Failure

Setting Test Limits​

Create, explore, and import test limits to quickly update your test sequences for different scenarios.​

  • Exporting Your Test Limits​
  • Importing Your Test Limits​
  • Adding Your Test Limits Files

Creating Test Configurations​

Use the Test Program Editor and your test requirements to create test configurations for your system.​

  • Creating Test Configurations​
  • Defining Multiple Test Flows

Binning DUTs Based on Test Results​

Describe the different ways that you can categorize DUTs based on the test results and implement a binning strategy.​

  • ​Overview of Binning​
  • Setting the Bin Definitions File​
  • Creating Hardware and Software Bins

Configuring the Execution of a Test Program​

Configure and run a test program in the test development environment.

  • Configuring Station Settings​
  • Configuring How TestStand Reports Test Results​
  • Configuring Station Options​
  • Configuring How TestStand Executes Your Code Modules​
  • Executing Your Test Program

Generating Test Reports

Implement a result collection and test reporting strategy in TestStand.

  • ​Configuring Report Options​
  • Selecting a Report Format​
  • Generating an ATML Report​
  • Configuring Test Result Collection

Debugging a Test Program

Use built-in TestStand features to identify and fix problems in a test sequence.

  • Tracing Test Program Execution​
  • Pausing and Stepping Through Execution​
  • Handling Execution Errors

Exploring Debugging Scenarios

Debug a test program in different unexpected situations.

  • ​Debugging Errors​
  • Debugging Failed Tests

Benchmarking Test Time

Identify and address issues that limit code execution speed.​

  • Benchmarking Test Time​
  • Optimizing TestStand Execution Speed​
  • Optimizing Hardware Execution Speed

Interacting with Tester Resources to Debug Issues​

Use InstrumentStudio to interact with tester resources to debug test issues.

  • Overview of InstrumentStudio​
  • Debugging DC Power Instruments​
  • Debugging Oscilloscopes​
  • Debugging Driver Sessions​
  • Debugging Multiple Instruments​
  • Exporting Data for Additional Analysis


Using the Digital Pattern Editor for Debugging

Use tools within the Digital Pattern Editor to further debug test failures.

  • Overview of Troubleshooting with the DPE​
  • Viewing Pin Status in Real-Time​
  • Debugging Pattern Execution​
  • Debugging the Digital Scope​
  • Analyzing Test Results Based on Parameter Sweeps

Running a Sequence with the STS Operator Interface​

Run a test program using the NI Semiconductor Test Operator Interface (OI) and get the true socket time.

  • Overview of the Operator Interface​
  • Configuring and Running a Lot
  • Viewing Test Results and Reports

Get started with Test Program Development with STS and .NET/C# Course today