Table Of Contents

VCSEL Generate Pulse and Read Measurement VI

Last Modified: January 12, 2021

Generates pulses and acquires raw measurement data from DUTs in serial or parallel mode.

You can select from the following instances of this VI:

Example

Refer to VCSEL I-V Measurement.lvproj in the labview\examples\VCSEL I-V Test\VCSEL I-V Measurement directory to learn how to use the VCSEL Generate Pulse and Read Measurement VI.

Generate Pulse and Read Measurement (Parallel)

Generates pulses and acquires raw measurement data from DUTs on all channels concurrently.

session handle in specifies a VCSEL session.

pulse configurations specifies the sweep pulse configuration data to generate pulses for measuring the DUTs on all channels.

amplitude (A) specifies the magnitude of the pulse current level.

pulse on time (s) specifies the period of time when a single pulse maintains high voltage level. The valid range of pulse on time (s) is 5 ns to 10 μs.

pulse duty cycle (%) specifies the ratio of pulse on time (s) to the total period of a pulse waveform in percentage.

pulse polarity specifies the polarity of the pulse.

pulse count specifies the number of pulses generated for each group of pulse settings.

channel index specifies the identifier of the channel under test.

trigger output terminal specifies the output terminal of a digital trigger. The default is None. The VCSEL I-V Test Subsystem supports exporting a digital trigger to only PFI 0 or PFI 1 on the front panel of the oscilloscope.

spd-note-note
Note  

All channels share the same trigger output terminal.

error in describes error conditions that occur before this node runs. This input provides standard error in functionality.

session handle out returns the VCSEL session.

raw waveforms returns the acquired raw data in waveforms.

error out contains error information. This output provides standard error out functionality.

Generate Pulse and Read Measurement (Serial)

Generates pulses for each channel and then acquires raw measurement data from DUTs channel by channel.

session handle in specifies a VCSEL session.

pulse configuration specifies the sweep pulse configuration data to generate pulse for measuring the DUT on each channel.

amplitude (A) specifies the magnitude of the pulse current level.

pulse on time (s) specifies the period of time when a single pulse maintains high voltage level. The valid range of pulse on time (s) is 5 ns to 10 μs.

pulse duty cycle (%) specifies the ratio of pulse on time (s) to the total period of a pulse waveform in percentage.

pulse polarity specifies the polarity of the pulse.

pulse count specifies the number of pulses generated for each group of pulse settings.

channel index specifies the identifier of the channel under test.

trigger output terminal specifies the output terminal of a digital trigger. The default is None. The VCSEL I-V Test Subsystem supports exporting a digital trigger to only PFI 0 or PFI 1 on the front panel of the oscilloscope.

spd-note-note
Note  

All channels share the same trigger output terminal.

error in describes error conditions that occur before this node runs. This input provides standard error in functionality.

reset? specifies whether to reset the SMU voltage to generate pulses for measuring the DUT on next channel. The default is FALSE.

session handle out returns the VCSEL session.

raw waveform returns the acquired raw data in a waveform.

error out contains error information. This output provides standard error out functionality.


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