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VCSEL I-V Test Subsystem Manual

Last Modified: January 13, 2021

The VCSEL I-V Test Subsystem provides a customizable solution to high-speed pulse testing on vertical-cavity surface-emitting laser (VCSEL) DUTs individually or testing on up to four VCSEL DUTs in parallel.

This manual contains an overview of the VCSEL I-V Test Subsystem and its components, procedures to set up and operate the subsystem, load board design guidelines, subsystem specifications, and additional reference information. Refer to or the VCSEL I-V Test Software Help, which is installed with the software, for API reference and example VI documentation.

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