Table Of Contents

Specifications

Version:
    Last Modified: January 13, 2021

    Definitions

    Warranted specifications describe the performance of a model under stated operating conditions and are covered by the model warranty.

    Characteristics describe values that are relevant to the use of the model under stated operating conditions but are not covered by the model warranty.

    • Typical specifications describe the performance met by a majority of models.
    • Nominal specifications describe an attribute that is based on design, conformance testing, or supplemental testing.

    Specifications are Typical unless otherwise noted.

    Conditions

    Specifications are valid under the following conditions unless otherwise noted:

    • VCSEL I-V Test Subsystem temperature is within the ambient temperature range of 20 °C to 30 °C
    • VCSEL I-V Test Subsystem hardware configuration only includes components specified in the Hardware Overview section

    Subsystem Pulse Generation Setting Specifications

    Programmable width range

    5 ns to 10 μs

    Width resolution

    333 ps

    Burst period

    5 ms, minimum

    spd-note-note
    Note  

    Burst period is the maximum amount of time allowed for one series of a continuous pulse train.

    Burst time

    1 ms, maximum

    Break time

    Burst time ≤ 0.25 ms

    5 ms - Burst time

    Burst time > 0.25 ms

    Burst time x 19

    Figure 1. VCSEL I-V Test Subsystem Pulse Definition
    1. Amplitude
    2. Pulse width (duration)
    3. Cycle (period)
    4. Rising (leading) edge; positive slope
    5. Falling (trailing) edge; negative slope
    spd-note-note
    Note  

    Duty Cycle = Pulse Width / Cycle

    Figure 2. Maximum Allowed Pulse Counts Over Duty Cycle Within One Pulse Burst

    Positive pulse rise time

    3 ns (0 A to 85% of Settled Current)

    Negative pulse fall time

    3 ns (0 A to 85% of Settled Current)

    Table 1. Current Programming and Measurement Accuracy
    VCSEL Forward Voltage Measurement Range Maximum Pulse Current Output[1] Minimum Current Setting Step[2] Accuracy[3]
    Full Impedance NI-4134 Configuration Half Impedance NI-4134 Configuration
    < 10 ns ≥ 10 ns < 10 ns ≥ 10 ns Current Setting[4] Current Measurement Voltage Measurement
    ±3.1 V 2 A 2.1 A 4 A 4.2 A 2 mA 3% + 38.7 mA 2% + 38.7 mA 2.3% + 38 mV
    ±7.9 V 1.8 A 1.9 A 3.8 A 3.9 A 3 mA 3% + 38.8 mA 2.3% + 38.8 mA 2.7% + 76 mV
    ±15.8 V 1.5 A 1.6 A 3.3 A 3.4 A 5 mA 3% + 39.1 mA 2.1% + 39.1 mA 2.3% + 139 mV
    ±27.5 V 1.1 A 1.2 A 2.5 A 2.7 A 10 mA 3% + 40.1 mA 2.7% + 40.1 mA 3% + 266 mV

    NI-4134 Specifications

    Absolute maximum voltage input from SMU

    ±125 V

    Primary pulse output resistance

    50 Ω

    Secondary pulse output resistance

    50 Ω

    External 12 V power input
    Current draw

    Normal operation

    140 mA (DC)

    Inrush at power-on

    1 A

    Power draw

    1.7 W

    USB communication/control

    Current draw

    1 mA

    Power draw

    5 mW

    BNC Cable Specifications

    Frequency Range

    Minimum

    DC

    Maximum

    4 GHz

    Impedance

    50 Ω

    MXI-Express Interface Specifications

    Cable type

    MXI-Express Gen 3 x8

    Number of lanes

    8

    Raw bandwidth

    64 Gb/s

    Attenuator Specifications

    Frequency Range

    Minimum

    DC

    Maximum

    3 GHz

    Nominal attenuation

    30 dB

    Impedance

    50 Ω

    Subsystem Component Specifications

    Refer to the product documentation for the following subsystem components on ni.com/manuals to view detailed component specifications.

    • 1 The values in the Current Programming and Measurement Accuracy table describe the maximum pulse current output when the VCSEL forward voltage is at the maximum of the specified measurement range.
    • 2 Minimum current setting step is limited by VCSEL I-V Test Subsystem noise.
    • 3 The VCSEL I-V Test Subsystem must be within ±3 °C of the temperature taken during the most recent compensation procedure execution. Measurement error caused by signal reflection is excluded from subsystem measurements.
    • 4 The Current Setting specification does not account for the characteristic difference between the known-good DUT used for subsystem compensation and the actual DUT.

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