Table Of Contents

VCSEL I-V Test PXI Subsystem

Version:
    Last Modified: January 11, 2021

    The VCSEL I-V Test PXI Subsystem is a standalone subsystem that utilizes the following components:

    • PXIe-4135 source measure unit (SMU)
    • NI-4134 pulse generator
    • PXIe-5162 oscilloscope
    • PXIe-1092 chassis
    • PXIe-8880 controller
    • VCSEL I-V Test Software

    For package test applications, you must design and supply a load board to use with the VCSEL I-V Test PXI Subsystem. Refer to the Load Board Design section to view a reference load board design and understand guidelines for the load board design.

    Figure 1. PXI Subsystem Package Test Block Diagram
    Table 1. PXI Subsystem Package Test Block Diagram Key
    Hardware Block Load Board Block DUT I/O Connector
    Resistor Switch Measurement Signal Data

    For wafer test applications, the NI-4134 and PXIe-5162 use differential probes to probe each die on the wafer directly.

    Figure 2. PXI Subsystem Wafer Test Block Diagram
    Table 2. PXI Subsystem Wafer Test Block Diagram Key
    Hardware Block Wafer Block DUT I/O Connector
    Resistor Switch Measurement Signal Data
    Ground            

    Recently Viewed Topics