The VCSEL I-V Test PXI Subsystem is a standalone subsystem that utilizes the following components:
For package test applications, you must design and supply a load board to use with the VCSEL I-V Test PXI Subsystem. Refer to the Load Board Design section to view a reference load board design and understand guidelines for the load board design.
|Hardware Block||Load Board Block||DUT||I/O Connector|
For wafer test applications, the NI-4134 and PXIe-5162 use differential probes to probe each die on the wafer directly.
|Hardware Block||Wafer Block||DUT||I/O Connector|