Table Of Contents

VCSEL I-V Test MXI Subsystem

Version:
    Last Modified: January 11, 2021

    The VCSEL I-V Test MXI Subsystem integrates with your computer by utilizing the following components:

    • PXIe-4135 source measure unit (SMU)
    • NI-4134 pulse generator
    • PXIe-5162 oscilloscope
    • PXIe-1092 chassis
    • MXI-Express Gen-3 x16 system consisting of a PCIe-8398 host interface card and a PXIe-8398 remote control module
      spd-note-note
      Note  

      The VCSEL I-V Test MXI Subsystem includes only one PXI chassis. To connect multiple PXI chassis to your computer, refer to the MXI-Express Gen-3 x16 User Manual.

    • VCSEL I-V Test Software

    For package test applications, you must design and supply a load board to use with the VCSEL I-V Test MXI Subsystem. Refer to the Load Board Design section to view a reference load board design and understand guidelines for the load board design.

    Figure 1. MXI Subsystem Package Test Block Diagram
    Table 1. MXI Subsystem Package Test Block Diagram Key
    Hardware Block Load Board Block DUT I/O Connector
    Resistor Switch Measurement Signal Data

    For wafer test applications, the NI-4134 and PXIe-5162 use differential probes to probe each die on the wafer directly.

    Figure 2. MXI Subsystem Wafer Test Block Diagram
    Table 2. MXI Subsystem Wafer Test Block Diagram Key
    Hardware Block Wafer Block DUT I/O Connector
    Resistor Switch Measurement Signal Data
    Ground            

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