Table Of Contents

VCSEL I-V Test Subsystem Overview

Last Modified: January 13, 2021

The VCSEL I-V Test Subsystem generates customizable high-speed pulse trains to characterize the current-voltage (I-V) relationship of a VCSEL DUT by measuring the pulse signal of the DUT.

The VCSEL I-V Test Subsystem provides the following two options to execute high-speed pulse testing on VCSEL DUTs:
The content throughout this manual applies to all VCSEL I-V Test Subsystem options unless otherwise noted.

Content applies to the VCSEL I-V Test PXI Subsystem.

Content applies to the VCSEL I-V Test MXI Subsystem.


Recently Viewed Topics