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Measurement Compensation

Last Modified: January 13, 2021

The VCSEL I-V Test Subsystem requires system compensation and pulse compensation before the subsystem can perform I-V measurements on VCSEL DUTs. System and pulse compensation gathers data about subsystem components and pulse settings to characterize subsystem performance and ensure accurate I-V measurements during test execution.

System compensation characterizes subsystem components, including the NI-4134 pulse generator, the PXIe-5162 oscilloscope, attenuators, and the BNC cables that connect these components to the load board. Perform system compensation if any connections within the VCSEL I-V Test Subsystem change, such as a cable replacement, or if the facility environment exceeds the environmental specifications for the subsystem.

Pulse compensation characterizes the specified pulse train with an open circuit, a shorted circuit, and a known-good DUT circuit. Then, the subsystem uses the compensation data to adjust the voltage output of the PXIe-4135 SMU in order to generate a pulse with the specified current amplitude.

Perform pulse compensation after any changes to the settings for the pulse measurements that the VCSEL I-V Test Subsystem executes or after any changes to the subsystem mode of operation. You can use the VCSEL I-V Test Software to perform system compensation and pulse compensation.


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