Table Of Contents

Channel Configurations

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    Last Modified: January 13, 2021

    The VCSEL I-V Test Subsystem can support one channel or multiple channels for DUT testing, depending on the subsystem hardware configuration.

    The quantity of NI-4134 pulse generators and PXIe-4135 source measure units (SMU) in the subsystem determines the number of measurement channels in the subsystem.


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