If a test automation program reaches a break point while the corresponding Semiconductor Device Control Add-On large panel is open, you can use the large panel
to edit register, field, and DIO pin values at that point in the program. After you
finish editing these values, you can resume test program execution.
Before you begin this procedure, insert a break point at the point in your program
where you intend to change the digital communication value of the register, field,
or DIO pin.
Complete the following steps to edit register, field, and DIO pin values at a break
point in a monitored test automation program.
Run the test automation program and monitor the program execution in the Semiconductor Device Control Add-On. Refer to Monitoring a Test Automation Program for more
information about monitoring program execution.
Wait for the test automation program to reach the break point you set
After the program reaches the break point, click Control
to enable editing of register, field, and DIO pin values.
Update the values of registers, fields, and DIO pins as needed.
Click Monitor to disable editing of registers, fields,
and DIO pins, and resume test program execution.
If you resume test program
execution while the large panel is in control mode, you can edit the
controls on the large panel while the test program executes. Click
Monitor before resuming the test automation
program to prevent unintentional edits to register, field, and DIO pin