Table Of Contents

Controlling Digital Communication Values During Test Execution

Last Modified: November 6, 2020

If a test automation program reaches a break point while the corresponding Semiconductor Device Control Add-On large panel is open, you can use the large panel to edit register, field, and DIO pin values at that point in the program. After you finish editing these values, you can resume test program execution.

Before you begin this procedure, insert a break point at the point in your program where you intend to change the digital communication value of the register, field, or DIO pin.

Complete the following steps to edit register, field, and DIO pin values at a break point in a monitored test automation program.

  1. Run the test automation program and monitor the program execution in the Semiconductor Device Control Add-On. Refer to Monitoring a Test Automation Program for more information about monitoring program execution.
  2. Wait for the test automation program to reach the break point you set previously.
  3. After the program reaches the break point, click Control to enable editing of register, field, and DIO pin values.
  4. Update the values of registers, fields, and DIO pins as needed.
  5. Click Monitor to disable editing of registers, fields, and DIO pins, and resume test program execution.
    spd-note-notice
    Notice  

    If you resume test program execution while the large panel is in control mode, you can edit the controls on the large panel while the test program executes. Click Monitor before resuming the test automation program to prevent unintentional edits to register, field, and DIO pin values.


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