Schedule a high-resolution data acquisition on a device.
You can also schedule a burst data set collection to run on a device
periodically so you can compare high-resolution data over time.
Complete the following steps to schedule high-resolution data acquisition on a device:
Double-click a device and select the
Device Properties tab.
This tab is not available for thermal imaging device configuration pages.
Enable burst mode checkbox.
Burst Collection Conditions section, click
Edit Condition dialog box, specify how frequently to acquire high-resolution data.
Burst Collection Settings section, specify the sample rate in Hz and acquisition length in seconds that you want InsightCM to use for the scheduled
high-resolution data acquisition.
Update the device configuration.