PXIe-6570 Overview

The PXIe-6570 is a 32-channel, 2-slot, 100 MVector/s digital pattern instrument featuring enhanced capabilities for semiconductor characterization, production test, and validation test; it is designed for semiconductor test engineers in digital testing. Use the PXIe-6570 in applications including digital and mixed signal systems functional test, specification characterization for timing and voltage, and parametric measurement tests.

Device Capabilities

The PXIe-6570 has the following features and capabilities.

  • 100 MHz vector rate
  • System channel count up to 256
  • Pattern formats including non-return, return to low, return to high, surround by complement
  • 31 time sets for pattern timing
  • 128 M per channel vector memory depth
  • Supports multisite testing, up to 8 sites per digital pattern instrument
  • Resources for 8 source and 8 capture sites

Driver Support

NI recommends that you use the newest version of the driver for your module.

Table 1. Earliest Driver Version Support
Driver Name Earliest Version Support
NI-Digital Pattern Driver 16.0