Specifies the method for performing the ACP measurement.

Syntax

Namespace: NationalInstruments.RFmx.LteMX

public enum RFmxLteMXAcpMeasurementMethod

Members

NameValueDescription
Normal0

The ACP measurement acquires the spectrum using the same signal analyzer setting across frequency bands. Use this method when measurement speed is desirable over higher dynamic range.

DynamicRange1

The ACP measurement acquires the spectrum using the hardware-specific optimizations for different frequency bands. Use this method to get the best dynamic range. Supported Devices: PXIe-5665/5668.

SequentialFft2

The ACP measurement acquires I/Q samples for a duration specified by the SetSweepTimeInterval(string, double) method. These samples are divided into smaller chunks. The size of each chunk is defined by the SetSequentialFftSize(string, int) method. FFT is computed on each of these chunks. The resultant FFTs are averaged to get the spectrum and is used to compute ACP. If the total acquired samples is not an integer multiple of the FFT size, the remaining samples at the end of acquisition are not used for the measurement. Sequential FFT method should be used for the following scenarios.

  1. While performing fast ACP measurements by utilizing smaller FFT sizes. However, accuracy of the results may be reduced.

  2. When measuring signals with time-varying spectral characteristics, sequential FFT with overlap mode set to Automatic should be used.

  3. For accurate power measurements when the power characteristics of the signal vary over time averaging is allowed.

Note

For multi-Span FFT, the averaging count should be 1.