WLR Test Software 21.5 Known Issues

Überblick

This document contains the WLR Test Software known issues that were discovered before and since the release of WLR Test Software 21.5. Known issues are performance issues or technical bugs that NI has acknowledged exist within this version of the product.

 

Not every issue known to NI appears on this list; it is intended to show the most severe and common issues that you may encounter and provide workarounds when possible. Other technical issues that you may encounter could occur through normal product use or system compatibility issues. You may find more information on these issues in NI’s Product Documentation, Knowledgebase, or Community.

Bug Number

Legacy ID

Description

Details

1516264

Cannot delete newly-created lot file and test sequence file

You cannot delete a newly-created lot file or test sequence file from the WLR Test Soft Front Panel.

Workaround:

  1. Delete the lot file and test sequence file from C:\ProgramData\National Instruments\WLR_Test\SoftFrontPanel\Configuration\Lot Configs and <Public Documents>\National Instruments\WLR_Test\SoftFrontPanel\Test Sequences respectively.
  2. Restart the WLR Test Soft Front Panel.

Reported Version:

WLR Test Software 21.5

Resolved Version:

N/A

Added:

Jul 20, 2021

1506846

Memory growth in LabVIEW or C# example

Memory usage continues to grow when you use Stress and Measure functions in a loop. The stress result and measure result take memory when you call the functions and the time of memory release is determined by the memory recovery mechanism of LabVIEW and C#.

Workaround:

(C#) In C# examples, when you have large sets of stress data or measure data, you need to set the measure and stress results to null and call System.GC.Collect() to release the memory by Garbage Collection if you do not need the data anymore. You can lean more about .NET garbage collection through the System.GC class.

(LabVIEW) You can directly use the Stress and Measure APIs when you need to collect large sets of stress and measure data. Use the In Place Element structure in a loop and call stress and measure APIs in In Place Element structure. It is better to save the stress and measure data into a file immediately when you get the stress and measure data.
If you need to pass the data, you can create a data value reference and add the read/write element of the data value reference in the In Place Element structure. Operate the data in the In Place Element structure does not require the LabVIEW compiler to copy data values and maintain those values in memory.

Reported Version:

WLR Test Software 21.5

Resolved Version:

N/A

Added:

Jul 20, 2021

1244668

Overshooting glitches happen when sourcing voltages values in sequential voltage ranges

For WLR LabVIEW and C# APIs and WLR Test Soft Front Panel, voltage level autorange of the NI-DCPower is On. So when you use the NI-DCPower device, overshooting glitches can happen when sourcing voltages in sequential voltage ranges.

Workaround:

You can mitigate the overshooting glitches by using a larger source delay (larger than 50 us from experiments) before taking the measurement after sourcing a voltage in a different voltage range. Refer to PXIe-4135specification for the supported voltage level ranges.

Reported Version:

WLR Test Software 21.5

Resolved Version:

N/A

Added:

Jul 20, 2021

1246272

Reported error is unclear when specifying Steps to 1 for Measure (Voltage Sweep)

When you set Steps on the Measure (Voltage Sweep) tab to 1 in the WLR LabVIEW example application while keeping others as default values, error -2147221750 occurs - "Wafer Level Reliability Test Software: The length of bias for each terminal is inconsistent."
The reported error is unclear. The cause is that the Start and Stop voltage levels are different for the gate terminal. You cannot generate a sweeping voltage that contains only 1 step. 

Workaround:

Make sure the value of the Steps control is equal to or larger than 2 if you want to perform the sweeping measurements on the Measure (Voltage Sweep) tab.

Reported Version:

WLR Test Software 21.5

Resolved Version:

N/A

Added:

Jul 20, 2021

Final Time Issue Listed

Issues found in this section will not be listed in future known issues documents for this product.

There are currently no issues to list.

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Glossary of Terms

 

  • Bug ID - When an issue is reported to NI, you may be given this ID or find it on ni.com.  You may also find IDs posted by NI on the discussion forums or in KnowledgeBase articles.
  • Legacy ID – An older issue ID that refers to the same issue.  You may instead find this issue ID in older known issues documents.
  • Description - A few sentences which describe the problem. The brief description given does not necessarily describe the problem in full detail.
  • Workaround - Possible ways to work around the problem.
  • Reported Version - The earliest version in which the issue was reported.
  • Resolved Version - Version in which the issue was resolved or was no longer applicable. "N/A" indicates that the issue has not been resolved.
  • Date Added - The date the issue was added to the document (not the reported date).