Fig 1: PXI-2510
The NI PXI-2510 fault insertion unit (FIU) is designed for use in hardware-in-the-loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels, which when closed make the switch transparent to the system. You can open or short these channels to one of two fault buses, each of which offers a multiplexer with four possible inputs. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the NI LabVIEW Real-Time Module, this FIU is ideal for validating the reliability of control systems such as engine control units (ECUs), full authority digital engine controls (FADECs), and more with up to 2 A loading conditions.