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RF and Wireless Test

National Instruments supplies modular, software-defined RF instrumentation that can help you design and test your wireless devices. This approach makes it possible for you to harness industry-standard PC technologies, such as multicore processors and the PCI Express bus, to dramatically reduce your test times. With software-defined instruments, you can test multiple wireless standards using one system. In addition, you can use the PXI platform modularity to easily integrate DC and mixed-signal measurements, switching, and RAID storage devices.

RF Test Resources

New Technologies for Faster RF Measurements

Learn how new technologies such as multicore processors and PCI Express can help you perform RF measurements up to 10X faster.

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Technical Software-Defined RF Instrumentation for Multistandard Testing

See a demonstration of the NI software-defined RF instrumentation platform testing multiple wireless standards.

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RF Benchmark Comparisons White Paper

Read about the speed improvements that software-defined PXI RF instruments deliver over traditional instruments in a benchmark comparison.

Read the White Paper

Featured RF Test Applications