High-Speed Digital I/O Video Demonstrations

Publish Date: Aug 21, 2013 | 0 Ratings | 0.00 out of 5 |  PDF

Digital Validation Test with PXI
Learn how you can use high-speed digital I/O instruments in the PXI form factor for digital functional test at up to 200 MHz.

LCD Testing with High-Speed Digital Devices
Discover how a National Instruments digital waveform generator/analyzer is used to test the functionality of a simple memory device as well as to characterize its access time. The functional test employs the per-channel, per-clock-cycle comparison features of the digital waveform generator/analyzer.

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