Vector Signal Generators and Analyzers for RF Instrumentation
With the increase in complexity of wireless devices, it is becoming more challenging for test engineers to build test systems which can scale up to this increase in complexity. Newer wireless technologies require more bandwidth, more processing power, unconventional test cases, tight synchronization among instruments and much more. Modular RF Instruments have evolved to meet these challenges. Join this webinar to learn how PXI based Vector signal generators and analyzers can be used for RF Test.