Debugging with the Digital Pattern Editor and PXI Digital Pattern Instrument

Publish Date: Mar 24, 2017 | 0 Ratings | 0.00 out of 5 | Submit your Review

Overview

Learn how to use the Digital Pattern Editor and PXI Digital Pattern Instrument to debug digital test patterns and semiconductor devices. The Digital Pattern Editor features intuitive features, such as history RAM overlay for identifying failures and expected values, a digital scope view with live graphing of digital values over time, and a Shmoo plot to sweep multiple variables to visually identify passing and failing combinations


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