NIWeek Experts Panel: Is Your RF Test Bench Obsolete?

Publish Date: Sep 11, 2018 | 0 Ratings | 0.00 out of 5 | Submit your Review

Overview

Should your spectrum analyzer be in a museum or on an RF test bench? Microwave instrumentation technology—from MMICs to multicore CPUs—is changing. PC-based instruments are addressing an increasingly broad range of RF measurement problems. Given this trend, panelists answer questions about the benefits and challenges of modular instrumentation. As a result, you gain a better understanding of key instrumentation technologies and how they affect the capabilities of both today’s and tomorrow’s RF instruments. 

Panelists: 

  • Doug Johnson, Director of Engineering at Qualcomm Atheros
  • Wade Lowdermilk, Chief Technology Officer at RADX Technologies
  • Larry Desjardin, Founder of Modular Methods LLC
  • David Vye, Editor in Chief at Microwave Journal
  • Jin Bains, Vice President of RF R&D at National Instruments

 


Next Steps

Thank you for watching the NIWeek Experts Panel. Learn more about the NI approach to RF and wireless test with the additional resources below. 

 

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